Velazco / Fouillat / Reis Radiation Effects on Embedded Systems

1. Auflage 2007
ISBN: 978-1-4020-5646-8
Verlag: Springer Netherlands
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 269 Seiten

This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.

Autoren/Hrsg.

Velazco, Raoul

Fouillat, Pascal

Reis, Ricardo

Inhaltsverzeichnis

1;CONTENTS;5
2;PREFACE;7
3;Radiation Space Environment;9
3.1;1 Space radiation effects;9
3.2;2 Other effects;15
3.3;References;17
4;Radiation Effects in Microelectronics;18
4.1;1. Introduction;18
4.2;2. MOS devices;20
4.3;3. Bipolar devices;25
4.4;4. Single-event effects;30
4.5;5. Summary;33
4.6;Acknowledgments;34
4.7;References;34
5;In-flight Anomalies on Electronic Devices;37
5.1;1. Introduction;37
5.2;2. Overview of radiation effects;38
5.3;2. In-flight anomalies and the space environment;41
5.4;3. Cumulated effects;46
5.5;4. Single event effects;55
5.6;5. The particular case of sensors;63
5.7;6. Dedicated instruments and experiments;71
5.8;References;73
6;Multi-level Fault Effects Evaluation;75
6.1;1. Introduction;75
6.2;2. The FARM model;77
6.3;3. Assumptions;80
6.4;4. Fault injection at the transistor level;82
6.5;5. Fault injection at the gate and register-transfer level;86
6.6;6. Fault injection at the system level;89
6.7;7. Conclusions;92
6.8;References;93
7;Effects of Radiation on Analog and Mixed-Signal Circuits;95
7.1;1. Introduction;95
7.2;2. Analog testing;97
7.3;3. First case study: SRAM-based FPAAs;100
7.4;4. Second case study: study: A/D converters;108
7.5;5. Analog self-checking design applied to SEUs and SETs mitigation;119
7.6;6. Concluding remarks;123
7.7;References;124
8;Fundamentals of the Pulsed Laser Technique for Single- Event Upset Testing;126
8.1;1. Introduction;126
8.2;2. Fundamentals of the laser testing technique;127
8.3;3. Pulsed laser systems for ICs testing;132
8.4;4. Applications of laser systems;135
8.5;5. Conclusions;144
8.6;Acknowledgments;145
8.7;References;145
9;Design Hardening Methodologies for ASICs;147
9.1;1. Introduction;147
9.2;2. Hardening against TID effects ;148
9.3;3. Hardening against SEEs ;155
9.4;4. Conclusion ;161
9.5;References;162
10;Fault Tolerance in Programmable Circuits;165
10.1;1. Introduction;165
10.2;2. Radiation effects on SRAM-based FPGAs;167
10.3;3. Architectural SET and SEU mitigation techniques for SRAM-based FPGAs;172
10.4;4. High- level SEU mitigation techniques for SRAM- based FPGAs based on TMR;176
10.5;References;183
11;Automatic Tools for Design Hardening;186
11.1;1. Introduction;186
11.2;2. Automatic hardening of RTL designs;187
11.3;3. Automatic insertion of hardware redundancy;190
11.4;4. Automatic insertion of information redundancy;195
11.5;5. Error recovery actions;201
11.6;6. Conclusions;202
11.7;References;203
12;Test Facilities for SEE and Dose Testing;204
12.1;1. Introduction;204
12.2;2. Response of devices to radiation;205
12.3;3. Standards and guidelines;211
12.4;4. Test facilities and domain of application;214
12.5;Acknowledgment;233
12.6;References;233
13;Error Rate Prediction of Digital Architectures: Test Methodology and Tools;236
13.1;1. Introduction;236
13.2;2. Radiation ground testing requirements and objectives;237
13.3;3. Estimating error rates for a digital architecture;248
13.4;4. Combining radiation ground testing with fault injection sessions: an example;254
13.5;5. Dealing with more complex architectures;260
13.6;References;261
14;Using the SEEM Software for Laser SET Testing and Analysis;262
14.1;1. Introduction;262
14.2;2. Laser induced SET;263
14.3;3. SET analysis with laser testing and SEEM;266
14.4;4. Conclusions;270
14.5;References;270
15;INDEX;272