Buch, Englisch, 269 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 429 g
Buch, Englisch, 269 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 429 g
ISBN: 978-90-481-7417-1
Verlag: Springer Netherlands
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Geowissenschaften Umweltwissenschaften Nuklearer Strahlenschutz, Nuklearenergie
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
- Mathematik | Informatik EDV | Informatik Technische Informatik Computersicherheit Kryptographie, Datenverschlüsselung
- Naturwissenschaften Chemie Physikalische Chemie Nuklearchemie, Photochemie, Strahlenchemie
- Technische Wissenschaften Energietechnik | Elektrotechnik Atomenergietechnik
Weitere Infos & Material
Radiation Space Environment.- Radiation Effects in Microelectronics.- In-flight Anomalies on Electronic Devices.- Multi-level Fault Effects Evaluation.- Effects of Radiation on Analog and Mixed-Signal Circuits.- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing.- Design Hardening Methodologies for ASICs.- Fault Tolerance in Programmable Circuits.- Automatic Tools for Design Hardening.- Test Facilities for SEE and Dose Testing.- Error Rate Prediction of Digital Architectures: Test Methodology and Tools.- Using the SEEM Software for Laser SET Testing and Analysis.
