E-Book, Englisch, Band 212, 594 Seiten, eBook
Fujiwara / Collins Spectroscopic Ellipsometry for Photovoltaics
Erscheinungsjahr 2019
ISBN: 978-3-319-75377-5
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark
Volume 1: Fundamental Principles and Solar Cell Characterization
E-Book, Englisch, Band 212, 594 Seiten, eBook
Reihe: Springer Series in Optical Sciences
ISBN: 978-3-319-75377-5
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se 2 .- Real Time and In-Situ Spectroscopic Ellipsometry of Cu y In 1-x Ga x Se 2 for Complex Dielectric Function Determination and Parameterization.- Cu 2 ZnSn(S,Se) 4 and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.