Spectroscopic Ellipsometry for Photovoltaics

Volume 1: Fundamental Principles and Solar Cell Characterization
1. Auflage 2018
ISBN: 978-3-319-75375-1
Verlag: Springer International Publishing

Buch, Englisch, Band 212, 594 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 1080 g

Reihe: Springer Series in Optical Sciences

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Zielgruppe

Research

Autoren/Hrsg.

Collins, Robert W.

Fujiwara, Hiroyuki

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
• Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Technische Wissenschaften Energietechnik | Elektrotechnik Solarenergie, Photovoltaik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se.- Real Time and In-Situ Spectroscopic Ellipsometry of CuInGaSe for Complex Dielectric Function Determination and Parameterization.- CuZnSn(S,Se) and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.

Über Autor(innen)

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a  professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. 

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.