CMOS RF Circuit Design for Reliability and Variability

1. Auflage 2016
ISBN: 978-981-10-0882-5
Verlag: Springer Nature Singapore

Buch, Englisch, 106 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 1825 g

Reihe: SpringerBriefs in Reliability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Zielgruppe

Research

Autoren/Hrsg.

Yuan, Jiann-Shiun

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Schaltungsentwurf
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Zuverlässigkeitstechnik

Inhaltsverzeichnis

CMOS Transistor Reliability and Variability.- Wireless Receiver and Transmitter Circuit Reliability.- Low Noise Amplifier Reliability and Variability.- Power Amplifier Reliability and Variability.- Voltage Controlled Oscillator Reliability and Variability.- Mixer Reliability.