Buch, Englisch, Band 3, 364 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 575 g
Reihe: IFIP Advances in Information and Communication Technology
Proceedings of the IFIP TC6 11th International Workshop on Testing of Communicating Systems (IWTCS'98) August 31-September 2, 1998, Tomsk, Russia
Buch, Englisch, Band 3, 364 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 575 g
Reihe: IFIP Advances in Information and Communication Technology
ISBN: 978-1-4757-6703-2
Verlag: Springer US
The following topics are discussed in detail: Types of testing; Phases of the testing process; Classes of systems to be tested; and Theory and practice of testing.
This book contains the selected proceedings of the 11th International Workshop on the Testing of Communicating Systems, formerly the International Workshop on Protocol Test Systems, sponsored by the International Federation for Information Processing (IFIP), and held in Tomsk, Russia, in August/September 1998.
will be essential reading for engineers, IT managers and research personnel working in computer sciences and telecommunications.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Preface. Part One: Past and Present of Research on Automata Testing. 1. Testing of Automata: From Experiments to Representations by Means of Fragments; I.S. Grunsky. Part Two: New Areas for Testing. 2. TMN and Telecommunication Networks Testing; M. Guiagoussou, M. Kadoch. 3. Conformance Testing Methodology of Internet Protocols Internet Application-Layer Protocol Testing - the Hypertext Transfer Protocol; R. Gescse. 4. Intelligent Protocol Analyzer for WWW Server Accesses with Exception Handling Function; T. Ogishi, et al. Part Three: Test Generation. 5. Factorized Test Generation for Multi-Input/Output Transition Systems; E. Brinksma, et al. 6. Test Generation for Specifications Modeled by Input/Output Automata; Q.M. Tan, A. Petrenko. 7. Distinguishing Tests for Nondeterministic Finite State Machines; S.Yu. Boroday. Part Four: Testing in Context. 8. Evaluation of Test Coverage for Embedded System Testing; J. Zhu, et al. 9. Test Suite Minimization for Testing in Context; N. Yevtushenko, et al. Part Five: Test Architectures and Concurrent Systems. 10. Test Architectures for Distributed Systems: State of the Art and Beyond; T. Walter, et al. 11. Using Partial-Orders for Detecting Faults in Concurrent Systems; A. Petrenko, et al. Part Six: Industrial Applications. 12. Conformance Testing of a Multimedia System Using PHACT; L.M.G. Feijs, et al. 13. An Industrial Experiment in Automatic Generation of Executable Test Suites for a Cache Coherency Protocol;H. Kahlouche, et al. 14. Autolink &endash; Putting SDL-Based Test Generation Into Practice; M. Schmitt, et al. Part Seven: Testing of Distributed Systems. 15. Testing Temporal Logic Properties in Distributed Systems; F. Dietrich, et al. 16. Programming Service Tests with TTCN; M. Anlauf. 17. A Guided Incremental Test Case Generation Procedure for Conformance Testing for CEFSM Specified Protocols; C. Bourhfir, et al. Part Eight: Testing from the Industrial Perspective. 18. Testing and Test Generation: State of the Art and Future Expectations; A. Ek. 19. Interoperability Test Suite Derivation for the ATM/B-ISDN Signaling Protocol; J.Shin, S. Kang. 20. Test Suite Migration Experiences for B-ISUP and B-MTP; C. Desroches, et al. Part Nine: Testability. 21. Qualitative Notions of Testability; B. Baumgarten, H. Wiland. Index of Contributors.
