Atomic Force Microscopy Based Nanorobotics

Modelling, Simulation, Setup Building and Experiments
2012
ISBN: 978-3-642-44501-9
Verlag: Springer

Buch, Englisch, Band 71, 344 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 546 g

Reihe: Springer Tracts in Advanced Robotics

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Zielgruppe

Research

Autoren/Hrsg.

Xie, Hui

Sitti, Metin

Onal, Cagdas

Régnier, Stéphane

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Robotik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Technik Allgemein Nanotechnologie

Inhaltsverzeichnis

Descriptions and challenges of AFM based nanorobotic systems.-

Instrumentation issues of an AFM based nanorobotic system.-

Nanomechanics of AFM based nanomanipulation.-

Teleoperation based AFM manipulation control.-

Automated control of AFM based nanomanipulation.-

Applications of AFM based nanorobotic systems.