Buch, Englisch, Band 43, 257 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 417 g
Lecture Notes of the Forum in Honor of Christian Landrault
Buch, Englisch, Band 43, 257 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 417 g
Reihe: Frontiers in Electronic Testing
ISBN: 978-94-007-3093-9
Verlag: Springer Netherlands
Model based testing is the most powerful technique for testing hardware and software systems. describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Mathematik | Informatik EDV | Informatik Informatik Logik, formale Sprachen, Automaten
- Mathematik | Informatik EDV | Informatik Professionelle Anwendung Computersimulation & Modelle, 3-D Graphik
- Mathematik | Informatik EDV | Informatik Technische Informatik Hardware: Grundlagen und Allgemeines
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
- Technische Wissenschaften Technik Allgemein Modellierung & Simulation
Weitere Infos & Material
Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond. 1: Open Defects in Nanometer Technologies; J. Figueras, et al. 2: Models for Bridging Defects; M. Renovell, et al. 3: Models for Delay Faults; S. M. Reddy. 4: Fault Modeling for Simulation and ATPG; B. Becker, I. Polian. 5: Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst. 6: Models in Memory Testing, From functional testing to defect-based testing; S. Di Carlo, P. Prinetto. 7: Models for Power-Aware Testing; P. Girard, H.-J. Wunderlich. 8: Physical Fault Models and Fault Tolerance; J. Arlat, Y. Crouzet. Index.
