E-Book, Englisch, 233 Seiten, Web PDF
Williams / Hopkins Troubleshooting on Microprocessor Based Systems
1. Auflage 2013
ISBN: 978-1-4832-9340-0
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, 233 Seiten, Web PDF
ISBN: 978-1-4832-9340-0
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark
The structure of a computing system presents unique problems when it fails to operate correctly and requires testing. This concise, yet comprehensive book describes the major test methods in current use, and their development from basic principles. Examines the sequence of tests which, built on each other, provide a suitable vehicle for testing digital systems, and the various types of testing equipment that should be applied for specific tests. An excellent introduction for those entering this increasingly complex world, the text will provide the reader with a firm basis on which to judge future development.
Autoren/Hrsg.
Weitere Infos & Material
1;Front Cover;1
2;Troubleshooting on Microprocessor Based Systems;4
3;Copyright Page;5
4;Table of Contents;16
5;Chapter 1. INTRODUCTION TO MICROPROCESSOR BASED SYSTEMS;20
5.1;1.1 The Digital Computer;21
5.2;1.2 Bus Structured Systems;22
5.3;1.3 Memory Mapped Systems;25
5.4;1.4 Tri-state Devices;26
5.5;1.5 Address Decoding;28
5.6;1.6 A Microcontroller;35
5.7;1.7 Programming Levels;37
6;Chapter 2. SYSTEM TESTING PROBLEMS;43
6.1;2.1 Hardware or Software?;44
6.2;2.2 Time Sequential, Bit Parallel Data;44
6.3;2.3 Bus Multiplexing;45
6.4;2.4 The Device Testing Problem;45
6.5;2.5 The System Kernel;47
6.6;2.6 CPU Testing;49
6.7;2.7 ROM Testing;49
6.8;2.8 RAM Testing;52
6.9;2.9 Input/Output Testing;55
6.10;2.10 Some Common System Problems;56
7;Chapter 3. SYSTEM TESTING PHILOSOPHY;69
7.1;3.1 Self-test Programs;71
7.2;3.2 Is There Really a Fault?;72
7.3;3.3 The Life-cycle of an Integrated Circuit;74
7.4;3.4 Stress Testing;75
7.5;3.5 Isolation Techniques;77
7.6;3.6 The Troubleshooting Tree;80
8;Chapter 4. THE USE OF CONVENTIONAL TEST EQUIPMENT;84
8.1;4.1 Multimeters;84
8.2;4.2 Frequency Counters;85
8.3;4.3 The Oscilloscope;86
8.4;4.4 The Limitations of Conventional Test Equipment;90
9;Chapter 5. HAND-HELD TOOLS;92
9.1;5.1 Logic Probes;93
9.2;5.2 Logic Pulsers;101
9.3;5.3 Stimulus-response Testing Using a Pulser and Probe;105
9.4;5.4 The Current Tracer;106
9.5;5.5 Logic Comparators;114
9.6;5.6 The Limitations of Hand-held Tools;115
10;Chapter 6. LOGIC ANALYSERS;117
10.1;6.1 Logic State Analysers;119
10.2;6.2 Logic Timing Analysers;130
10.3;6.3 Display Modes;133
10.4;6.4 Logic Analyser Features;141
11;Chapter 7. SIGNATURE ANALYSERS;150
11.1;7.1 The Nature of Digital Waveforms;151
11.2;7.2 Transition Counting;152
11.3;7.3 The Probability of Success Using the Transition Counting Technique;153
11.4;7.4 Cyclic Redundancy Check Codes;157
11.5;7.5 Signature Analysis;159
11.6;7.6 The Probability of Success Using Signature Analysis;162
11.7;7.7 A Simple Signature Analyser;168
11.8;7.8 Free-run Testing Using a Signature Analyser;172
11.9;7.9 ROM Testing During Free-run;176
11.10;7.10 Signature Analysis Test Loops;177
11.11;7.11 Retrofitting Signature Analysis;178
11.12;7.12 Limitations of Signature Analysis;179
11.13;7.13 Signature Analysis as a General Test Technique;180
12;Chapter 8. EMULATION;182
12.1;8.1 Development Systems;183
12.2;8.2 System Testing Using a Development System;194
12.3;8.3 Stand-alone Emulators;195
13;Chapter 9. SELF-TEST AND DIAGNOSTIC SOFTWARE;198
13.1;9.1 Self-test Routines;199
13.2;9.2 Diagnostic Tests;204
14;Chapter 10. TESTING PERIPHERAL RELATED FUNCTIONS;208
14.1;10.1 An Example of Sub-system Functional Testing;209
14.2;10.2 Testing Serial Data Communication Lines;211
14.3;10.3 Monitoring the IEEE-488 Instrumentation Bus;221
15;REFERENCES;229
16;INDEX;230
