Vanselow / Howe | Chemistry and Physics of Solid Surfaces VIII | Buch | 978-3-642-75764-8 | sack.de

Buch, Englisch, 464 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 727 g

Reihe: Springer Series in Surface Sciences

Vanselow / Howe

Chemistry and Physics of Solid Surfaces VIII


1. Auflage 2011
ISBN: 978-3-642-75764-8
Verlag: Springer

Buch, Englisch, 464 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 727 g

Reihe: Springer Series in Surface Sciences

ISBN: 978-3-642-75764-8
Verlag: Springer


The Series Chemistry and Physics of Solid Surfaces presents selected review articles predominantly from the area of gas/solid interfaces. It bridges the gap between conventional textbooks on surface science and the highly specialized research literature. Each volume contains extensive literature references and a detailed subject index.
Vanselow / Howe Chemistry and Physics of Solid Surfaces VIII jetzt bestellen!

Zielgruppe


Research

Weitere Infos & Material


1. Reactivity of Surfaces.- 1.1 Chemisorbed Phases—Alterations of the Substrate Bonds.- 1.2 Chemical Transformation—Alteration of the Adsorbate Bonds.- 1.3 Nonlinear Dynamics in Surface Reactions.- 1.4 Conclusion.- References.- 2. New Mechanisms for the Activation and Desorption of Molecules at Surfaces.- 2.1 Translational Activation of CH4.- 2.2 Collision Induced Dissociative Chemisorption and Collision Induced Desorption of CH4.- 2.3 New Methods for Activation: New Syntheses.- References.- 3. Photochemistry at Adsorbate-Metal Interfaces: Intra-adsorbate Bond Breaking.- 3.1 General Considerations.- 3.2 Experimental Considerations.- 3.3 Examples.- 3.4 Prospects.- References.- 4. Desorption Induced by Electronic Transitions.- 4.1 Mechanisms of DIET.- 4.2 Experimental Procedures for Positive and Negative Ion ESDIAD.- 4.3 DIET Studies of a Model System: PF3 on Ru{0001}.- 4.4 Summary and Conclusions.- References.- 5. Transition Metal Clusters and Isolated Atoms in Zeolite Cages.- 5.1 Preparation of Encaged Particles.- 5.2 Thermodynamic “Driving Forces” Favoring Locations and Particle Morphology.- 5.3 Mechanisms of Metal Particle Formation.- 5.4 Identification of Isolated Atoms and Electron Deficient Particles.- 5.5 Formation of Bimetallic Particles.- 5.6 Summary and Conclusions.- References.- 6. Studies of Bonding and Reaction on Metal Surfaces Using Second-Harmonic and Sum-Frequency Generation.- 6.1 Second-Harmonic Generation.- 6.2 Sum-Frequency Generation.- References.- 7. Surface Physics and Chemistry in High Electric Fields.- 7.1 Electric Fields at Metal Surfaces.- 7.2 Dispersion and Polarization Forces.- 7.3 Field-Induced Chemisorption.- 7.4 Field Evaporation.- 7.5 Thermal Field Desorption.- 7.6 Field-Induced Chemistry.- 7.7 Concluding Remarks.- References.- 8.Chaos in Surface Dynamics.- 8.1 Concepts in Chaos.- 8.2 Examples.- 8.3 Period Doubling.- 8.4 Hamiltonian Systems.- References.- 9. Ten Years of Low Energy Positron Diffraction.- 9.1 Low-Energy Electron Diffraction.- 9.2 The First LEPD Experiments (1979).- 9.3 Brightness Enhancement.- 9.4 Surface Structure Determinations with Modern LEPD: CdSe{1010} and CdSe{1120}.- 9.5 Positron Diffraction at Very Low Energy.- 9.6 Conclusions.- References.- 10. Time-of-Flight Scattering and Recoiling Spectrometry (TOF-SARS) for Surface Analysis.- 10.1 Historical Review.- 10.2 Experimental Method.- 10.3 Examples of Experimental Results.- 10.4 Summary.- References.- 11. Scanning Electron Microscopy with Polarization Analysis: Studies of Magnetic Microstructure.- 11.1 Spin Polarization of Secondary Electrons.- 11.2 Experimental.- 11.3 SEMPA Measurement Examples.- 11.4 Summary and Future Directions.- References.- 12. Low Energy Electron Microscopy.- 12.1 Fundamentals of LEEM.- 12.2 LEEM Studies of Clean Surfaces.- 12.3 LEEM Studies of Surface Layers.- 12.4 Outlook.- 12.5 Summary.- References.- 13. Atomic Scale Surface Characterization with Photoemission of Adsorbed Xenon (PAX).- 13.1 Introduction.- 13.2 Principles of the PAX-Technique.- 13.3 Selected Case Studies of Metallic Surfaces.- 13.4 Summary and Implications.- References.- 14. Theoretical Aspects of Scanning Tunneling Microscopy.- 14.1 General Tunneling Theory.- 14.2 STM Images and their Interpretation.- 14.3 Spectroscopy.- 14.4 Mechanical Interactions Between Tip and Sample.- 14.5 Conclusion.- References.- 15. Proximal Probes: Techniques for Measuring at the Nanometer Scale.- 15.1 Proximal Probes.- 15.2 Nanoscale Fabrication Using Proximal Probes.- 15.3 Conclusion.- References.- 16. Studying Surface Chemistry Atom-by-Atom Using theScanning Tunneling Microscope.- 16.1 Topography and Spectroscopy with the STM.- 16.2 Imaging Semiconductor Surface Chemistry Atom-by-Atom Using the STM.- 16.3 The Structure of the Si{111}-7 × 7 Surface.- 16.4 Site-Selective Reactions of Si{111}-7 × 7.- 16.5 Molecular Adsorption on Si{111}-7 × 7.- 16.6 Reactions That Involve Extensive Atomic Rearrangements.- 16.7 Doping Effects on Silicon Surface Chemistry.- 16.8 Conclusions and Prospects for the Future.- References.- 17. Bonding and Structure on Semiconductor Surfaces.- 17.1 Basic Mechanism Driving Surface Reconstruction.- 17.2 The Geometric and Electronic Structures of GaAs{110}.- 17.3 The GaAs{111}(2 × 2) Surface Reconstruction.- 17.4 Structure of the Si{111}7 × 7 Surface.- 17.5 The Ge{111} c(2 × 8) Reconstruction.- 17.6 Summary.- References.- 18. Tribology at the Atomic Scale.- 18.1 Concepts in Classical Tribology.- 18.2 Experimental Approaches.- 18.3 Theoretical Descriptions of Tribology.- 18.4 Summary and Future Directions.- References.- of Chemistry and Physics of Solid Surfaces IV (Springer Series in Chemical Physics, Vol. 20).- of Chemistry and Physics of Solid Surfaces V (Springer Series in Chemical Physics, Vol. 35).- of Chemistry and Physics of Solid Surfaces VI (Springer Series in Surface Sciences, Vol. 5).- of Chemistry and Physics of Solid Surfaces VII (Springer Series in Surface Sciences, Vol. 10).



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.