CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters

2. Auflage 2003
ISBN: 978-1-4020-7500-1
Verlag: Springer US

Buch, Englisch, 588 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 1115 g

Reihe: The Springer International Series in Engineering and Computer Science

CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived.

CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes the requirements of input and signal reconstruction filtering in case a converter is applied into a signal processing system.

CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes design details of high-speed A/D and D/A converters, high-resolution A/D and D/A converters, sample-and-hold amplifiers, voltage and current references, noise-shaping converters and sigma-delta converters, technology parameters and matching performance, comparators and limitations of comparators and finally testing of converters.

Zielgruppe

Research

Autoren/Hrsg.

de Plassche, Rudy J. van

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

1 The converter as a black box.- 2 Specifications of converters.- 3 High-speed A/D converters.- 4 High-speed D/A converters.- 5 High-resolution A/D converters.- 6 High-resolution D/A converters.- 7 Sample-and-hold amplifiers.- 8 Noise-shaping D/A conversion.- 9 Sigma-delta A/D conversion.- 10 Voltage and current references.- 11 Limitations of comparators.- 12 Technology and device matching.- 13 Testing of D/A and A/D converters.