Buch, Englisch, 354 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 723 g
Buch, Englisch, 354 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 723 g
Reihe: Springer Series in Optical Sciences
ISBN: 978-3-642-18442-0
Verlag: Springer
The acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theoretical basics, semiconductor fabrication, single-photon detection principles, imager design and applications of different spectral domains. Today, the solid-state fabrication capabilities for several types of image sensors has advanced to a point, where uncoooled single-photon electronic imaging will soon become a consumer product. This book is giving a specialist´s view from different domains to the forthcoming “single-photon imaging” revolution. The various aspects of single-photon imaging are treated by internationally renowned, leading scientists and technologists who have all pioneered their respective fields.
Zielgruppe
Graduate
Autoren/Hrsg.
Fachgebiete
- Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
- Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
Weitere Infos & Material
Fundamentals of noise in optoelectronics.- Semiconductor technology for single-photon image sensing.- Hybrid Avalanche Photodiode Array (APD) Imaging.- Electron Bombarded Semiconductor Image Sensors.- Silicon Photomultipliers, SiPM.- Electron-Multiplying CDs, EMCCD.- Monolithic Single-Photon Avalanche Photodetectors, SPAD.- Single-photon CMOS imaging through bandwidth optimization.- Architectures for low-noise CMOS electronic imaging.- Low-noise electronic imaging with double-gate FETs and charge-modulation devices.- Energy-sensitive single-photon X-ray and particle imaging.- Single-photon imaging for astronomy and aerospace applications.- Single-photon imaging for the life sciences.- Single-photon imaging for time-of-flight range 3D imaging.
