Test, Defect Tolerance, and Reliability
E-Book, Englisch, Band 37, 408 Seiten, eBook
Reihe: Frontiers in Electronic Testing
ISBN: 978-0-387-74747-7
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Test and Defect Tolerance for Crossbar-Based Architectures.- Defect-Tolerant Logic with Nanoscale Crossbar Circuits.- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics.- Test and Defect Tolerance for Reconfigurable Nanoscale Devices.- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology.- Defect Tolerance in Crossbar Array Nano-Architectures.- Test and Defect Tolerance for QCA Circuits.- Reversible and Testable Circuits for Molecular QCA Design.- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems.- QCA Circuits for Robust Coplanar Crossing.- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata.- Testing Microfluidic Biochips.- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems.- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips.- Reliability for Nanotechnology Devices.- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields.- Towards Nanoelectronics Processor Architectures.- Design and Analysis of Fault-Tolerant Molecular Computing Systems.