Raman Spectroscopy of Two-Dimensional Materials

1. Auflage 2019
ISBN: 978-981-13-1827-6
Verlag: Springer Nature Singapore

Buch, Englisch, Band 276, 261 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 582 g

Reihe: Springer Series in Materials Science

This book shows the electronic, optical and lattice-vibration properties of the two-dimensional materials which are revealed by the Raman spectroscopy. It consists of eleven chapters covering various Raman spectroscopy techniques (ultralow-frequency, resonant Raman spectroscopy, Raman imaging), different kinds of two-dimensional materials (in-plane isotropy and anisotropy materials, van der Waals heterostructures) and their physical properties (double-resonant theory, surface and interface effect). The topics include the theory origin, experimental phenomenon and advanced techniques in this area. This book is interesting and useful to a wide readership in various fields of condensed matter physics, materials science and engineering.

Zielgruppe

Research

Autoren/Hrsg.

Tan, Ping-Heng

Fachgebiete

• Naturwissenschaften Chemie Analytische Chemie Magnetresonanz
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Biomaterialien, Nanomaterialien, Kohlenstoff
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung

Inhaltsverzeichnis

Raman spectroscopy of monolayer and multilayer graphenes.- Raman spectroscopy of isotropic two-dimensional materials beyond graphene.- Raman spectroscopy of anisotropic two-dimensional materials.- Raman spectroscopy of van der Waals heterostructures.- Disorder and defects in two-dimensional mate-rials probed by Raman spectroscopy.- Raman Spectroscopy Study of Two-Dimensional Materials under Strain.- Double resonance Raman spectroscopy of two-dimensional materials.- Raman signatures of surface and interface effects in two-dimensional layered materials: theoretical insights.- Resonant Raman Spectroscopy of Two Dimensional Materials beyond Graphene.- Ultralow-frequency Raman spectroscopy of two-dimensional materials.- Raman imaging of two dimensional materials

Über Autor(innen)

Ping-Heng Tan is a Professor at the State Key Laboratory of Superlattices and Microstructures at Institute of Semiconductors, Chinese Academy of Sciences. He obtained his BS (1996) in Physics from Peking University, PhD(2001) from Institute of Semiconductors, Chinese Academy of Sciences. He worked at Walter Schottky Institut, Technische Universitaet Muenchen as a Postdoc Research Associate from 2001-2003. He was a KC-Wong Royal Society Fellow at Cambridge University from 2006-2007. His current research is on the optical properties of two-dimensional materials and semiconductor optoelectronic materials. Prof. Tan is the director of Chinese Light Scattering Committee, Chinese Physical Society (CPS); Convener of Semiconductor Physics Session, CPS Fall Meeting; Member of organizing committee of CPS Fall Meeting; Member of a council, CPS; International steering committee of ICORS. He is currently the editors of Semiconductor Science and Technology, npj 2D Materials and Applications, Journal of Raman Spectroscopy, Journal of Semiconductors, Journal of Light Scattering and Asian Journal of Physics. He was supported by National Science Fund for Distinguished Young Scholars in 2012 and was awarded Huang Kun Award on semiconductor physics and solid state physics in 2015.