Suwas / Field Advances in Texture, Microtexture, and Allied Techniques

Measurements, Analyses, and Application
1. Auflage 2025
ISBN: 978-981-965346-1
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 360 Seiten

Reihe: Materials Horizons: From Nature to Nanomaterials

This book presents the fundamentals of texture and microtexture with the latest developments in the field and relates the same for different materials and processes. Crystallographic phase and orientation define the anisotropy of crystalline materials. In polycrystalline materials, the preferred crystallographic orientation of grain distributions, also known as (crystallographic) texture, controls the properties of materials. The evaluation of texture has been traditionally carried out by X-ray diffraction and neutron diffraction. In recent times, microtexture-based techniques have been widely used not only to examine the crystallographic texture but also to investigate the micro-mechanisms controlling the development of texture and microstructure. It has, therefore, become almost mandatory to re-visit the physical phenomenon associated with materials from the viewpoint of microtexture. The individual chapters have been written by the renowned scientists working in the respective domain. The book can be a valuable reference for researchers and professionals interested in fundamentals of texture and microtexture and allied fields.

Zielgruppe

Research

Autoren/Hrsg.

Suwas, Satyam

Field, David P.

Inhaltsverzeichnis

Crystallographic texture-----Historical perspective and modern developments.- Basics of SEM based techniques for orientation imaging microscopy.- Electron Backscatter Diffraction based Strain Analysis in the Scanning Electron Microscope.- In Situ EBSD: A high throughput technique across the real and reciprocal space to decipher micro-mechanisms in materials.- Electron Channeling and Electron Channeling Contrast Imaging (ECCI).- Mesotexture: A key to understanding microstructural evolution during grain boundary engineering.- Controlling the Twinning-Induced grain boundary Character Distribution.- Unravelling the phenomenon of shear banding by electron back scatter diffraction.- Automated Reconstruction of Parent Phase Microtexture in A Displacive Phase Transformation.- Unravelling the mechanism of deformation and annealing.- Microstructure and texture development during deformation and recrystallization in two phase materials.- Application of in-situ EBSD in understanding the mechanism of transformation in shape memory alloys.- Development of Microtexture during Cyclic Deformation.- Dependence of environmental sensitivity on microtexture.- Understanding the micromechanism of deformation and annealing in Magnesium alloys by EBSD.- Understanding the kinematics of geological materials at microscale.

Über Autor(innen)

Satyam Suwas is a professor and chair of Materials Engineering at Indian Institute of Science, Bangalore, India. He obtained his Ph.D. in Materials and Metallurgical Engineering from IIT Kanpur and worked at Defence Metallurgical Research Laboratory, Hyderabad; University of Lorraine, France and RWTH Aachen, Germany before joining Indian Institute of Science. His specialization includes materials processing, crystallographic texture and mechanical behaviour of materials. He is a Humboldt fellow and has also been conferred with the Friedrich Wilhelm Bessel Research Award by the Humboldt foundation, Germany. He serves as editorial board member of many journals, and is the associate editor for Materials Characterization, and Current Science. 
David P. Field is a professor in the School of Mechanical and Materials Engineering, and the director of the Institute of Materials Research at Washington State University. He received his Ph.D. in Mechanical Engineering in 1991 from Yale University.  From 1990 to 2000 he was employed as a Sr. engineer at Alcoa Technical Center and then as the director of Technology at TexSEM Laboratories. He joined Washington State University in 2000. He has served in many editorial capacities and is currently the Editor-in-Chief of Materials Characterization. His research interest focusses upon the statistical description of microstructures with emphasis on polycrystalline materials including metals, ceramics, and electronic materials.