Little | Seminal Ideas and Controversies in Statistics | Buch | 978-1-032-49717-4 | sack.de

Buch, Englisch, 243 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 517 g

Reihe: Chapman & Hall/CRC Monographs on Statistics and Applied Probability

Little

Seminal Ideas and Controversies in Statistics


1. Auflage 2025
ISBN: 978-1-032-49717-4
Verlag: Taylor & Francis Ltd (Sales)

Buch, Englisch, 243 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 517 g

Reihe: Chapman & Hall/CRC Monographs on Statistics and Applied Probability

ISBN: 978-1-032-49717-4
Verlag: Taylor & Francis Ltd (Sales)


Statistics has developed as a field through seminal ideas and fascinating controversies. Seminal Ideas and Controversies in Statistics concerns a wide-ranging set of 15 important statistical topics, grouped into three general areas: philosophical approaches to statistical inference, important statistical methodology for applications, and topics on statistical design, focusing on the role of randomization. The key papers on each topic are discussed with commentaries to help explain them. The goal is to expand reader knowledge of the statistics literature and encourage a historical perspective.

Features

- Discusses a number of important ideas in the history of statistics, including the likelihood principle, Bayes vs. frequentist approaches to inference, alternative approaches to least squares regression, shrinkage estimation, hypothesis testing, and multiple comparisons

- Provides a deeper understanding and appreciation of the history of statistics

- Discusses disagreements in the literature, which make for interesting reading

- Gives guidance on various aspects of statistics research by reading good examples in the literature

- Promotes the use of good English style in the presentation of statistical ideas, by learning from well-written papers

- Includes an appendix of style tips on writing statistical papers

This book is aimed at researchers and graduate students in statistics and biostatistics, who are interested in the history of statistics and would like to deepen their understanding of seminal ideas and controversies. It could be used to teach a special topics course or useful for any researchers keen to understand the subject better and improve their statistical presentation skills.

Little Seminal Ideas and Controversies in Statistics jetzt bestellen!

Zielgruppe


Adult education, Professional Reference, and Professional Training


Autoren/Hrsg.


Weitere Infos & Material


1. Maximum likelihood. 2. To C or not to C-- that is the question. 3. Frequentist flaps: significance testing, hypothesis testing, or something else?. 4. Fiducial inference and the Behrens-Fisher problem. 5. Do you like the likelihood principle?. 6. A Bayesian/frequentist compromise: Calibrated Bayes. 7. Baseball averages, foreign cars, and shrinkage estimation. 8. Alternatives to least squares in regression. 9. Multiple perspectives on multiple comparisons. 10. Generalized Estimating Equations. 11.The Bootstrap and Bayesian Monte-Carlo methods. 12. Exploratory data analysis and data science. 13. Randomization in survey sampling. 14. Randomized clinical trials and the Neyman/Rubin causal model. 15. Propensity score methods.


Roderick J. A. Little is Richard D. Remington Distinguished University Professor Emeritus at the University of Michigan, where he also holds emeritus appointments in the Department of Statistics and the Institute for Social Research. After secondary school at Glasgow Academy, he received a B.A. in Mathematics from Gonville and Caius College, Cambridge University, and M.Sc. and Ph.D. degrees in Statistics from the Imperial College of Science and Technology, London University. Professor Little is a pioneer and thought leader in the fields of statistical analysis with missing data, Bayesian inference in sample surveys and causal inference. He has received some of the highest honors in statistics and science, including being elected to the U.S. National Academy of Medicine and American Academy of Arts and Sciences.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.