Strunk / Werner / Fortin Polycrystalline Semiconductors III

Erscheinungsjahr 1994
ISBN: 978-3-0357-0654-3
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 628 Seiten

This book covers the physics and technology of polycrystalline semiconductors by presenting the work of scientists who are concerned with a variety of polycrystalline materials in research, technology, and application, with a view to bridge the gap between fundamental and technological aspects of polycrystalline semiconductors.

Autoren/Hrsg.

Strunk, Horst P.

Werner, J.H.

Fortin, B.

Bonnaud, O.

Inhaltsverzeichnis

Preface
The Electrical Activity of Dislocations in Edge-Defined Film-Fed Growth Silicon
Correlation of Structural and Electronic Properties from Dislocations in Semiconductors
How Can Dislocations Enhance the Efficiency of Photovoltaic Solar Cells?
About the Electrical Conductivity of Dislocations in Multicrystalline Silicon Solar Cells
g-Tensors of Electrons Bound to 60°-Dislocations in Ge and Si
Formation of Misfit Dislocation Networks in Ge/Si as Dependent on the Substrate Orientation
In Situ Observations of Dislocation Motion in Polycrystalline Silicon during Straining Experiment in a High-Voltage Electron Microscope
Theoretical Study of the Atomic and Electronic Structures of Grain Boundaries in Semiconductors
Structure of Grain Boundaries in Polycrystalline Semiconductors
High Temperature Atomic Simulations of Grain Boundaries in Semiconductors Using a New Type of Periodic Boundary Conditions
Calculation of the Free Energy of Different Configurations of {001}S=13 Grain Boundary in Silicon by the Quasiharmonic Method
Improved Quasiharmonic Methods for Grain Boundary Free Energy Calculations in Silicon
Calculation of Grain Boundary Free Energy by Molecular Dynamics and Tests on Silicon Perfect Crystal
Möbius Tight Binding Calculations for Grain Boundaries
Structural and Electrical Transport Properties of Grain Boundaries in High Temperature Superconductors
The Microstructure of Sm2-xCexCuO4-d
Interaction of Grain Boundaries, Dislocations and Impurity Atoms in Semiconductors
Oxygen and Copper Precipitation in the Vicinity of the Silicon-Silicon-Dioxide Interface: Microstructure and Electrical Properties
Non-Ideal I-V-Characteristics of Block-Cast Silicon Solar Cells
Copper and Nickel Precipitation in a S=25 Silicon Bicrystal
Desorption Energy of Oxygen Adsorbed on Un-Intentionally Doped Low Pressure Chemical Vapor Deposited Silicon Films
Segregation and Precipitation of Platinum Silicides in Si/SiO2 Interfaces and Dislocations
Calculation of the Atomic and Electronic Structure of the {113} Planar Interstitial Defects in Silicon
Local Grain Boundary Property Measurements
Local Investigation of the Electrical Properties of Grain Boundaries in Silicon
Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
Minority Charge Carrier Trapping at Grain Boundaries Provided with a High Barrier Schottky Contact
Electrical Transport in Polycrystalline Semiconductors
Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors
Effect of Local Inhomogeneities on the Electrical Properties of Polycrystalline Silicon
On Some Photoelectrical Interface Processes in Mixed Semiconductor Heterostructures with Photosynthetic Pigment
Polycrystalline Silicon-Silicon Carbide Emitters for Heterojunction Transistors
Investigation of the Defect Distribution in Polycrystalline Silicon
Properties of Thermoluminescence and Thermally Stimulated Conductivity in Polycrystalline Materials: Numerical Studies
Microscopic Processes in Crystallisation
Laser Beam Application in Semiconductor Technology
In-Situ Excimer Laser Induced Crystallization of Hydrogenated Amorphous Silicon Thin Films
Microstructure of Poly-Si Obtained by Rapid Thermal Annealing of Amorphous Silicon Films
Crystallisation Behaviour of Amorphous Thin Si Films Produced by Low Pressure Chemical Vapor Deposition
Beam Shape Effects with Excimer Laser Crystallisation of Plasma Enhanced and Low Pressure Chemical Vapor Deposited Amorphous Silicon
Crystalline and Electrical Properties of Polysilicon Obtained by Annealing of Si Films Produced by Low Pressure Chemical Vapor Deposition from Si2H6
Determination of Crystallisation Parameters of a-Si from In Situ Conductance Measurements and Transmission Electron Microscopy Analysis
Grain Boundary Character Distribution in Rapidly Solidified and Annealed Silicon Ribbons
Decomposition and Microstructure during Crystallization of Amorphous GexSi1-x Films
A Comparison of Polysilicon Produced by Excimer (ArF) Laser Crystallisation and Low-Temperature (600°C) Furnace Crystallisation of Hydrogenated Amorphous Silicon (a-Si:H)
Microstructure and Transistor Properties of Solid-State-Crystallised Polysilicon: Effect of a Prolonged 600°C Anneal
The Art of Living with Defects in Silicon: Gettering and Passivation
Hydrogen and Deuterium in Semi-Crystalline Silicon Wafers and Solar Cells
External Gettering around Extended Defects in Multicrystalline Silicon Wafers
Evidence for Defect Metastability in Hydrogen Passivated Fine Grain Polycrystalline Silicon
Deuterium Effusion from Microcrystalline Sputtered Silicon Thin Films: Hydrogen Stability and Bonding Configurations
Defect Structure of Multicrystalline Chemical Vapor Deposited Silicon Films
Optical and Photoelectrical Properties of Microcrystalline Silicon Layers in Relation to Structural Ordering
Photo-Induced and Thermally Stimulated Degredation in a-Si:H: Mechanism of Defect Creation
Electrical Properties and Microstructure of Metal Oxides Varistors
General and Characteristic Features of the Structure of Polycrystalline and Non-Crystalline Silicon
Properties of Anodically Oxidized Polycrystalline Silicon Layers
Properties of Multicrystalline Silicon Heat Treated by Classical and Rapid Thermal Processing
A Contribution to the Characterization of Multicrystalline Solar Silicon
Silicon Layers Grown by Liquid Phase Epitaxy on Polycrystalline Silicon Substrates
Structural, Electrical and Optical Properties of Reactive Magnetron Sputtered Poycrystalline ZnO: Al Films as a Function of the Oxygen Partial Pressure during Deposition
Photovoltaic Solar Cells: State of the Art, National Strategies and Perspectives
Polycrystalline Silicon Films, New Candidates for Photovoltaics?
Polycrystalline Silicon Thin Films on Glass for Photovoltaic Cell Applications
Charge Build-Up in Solar Cells
Treedimensional Modelling of a Back Junction Solar Cell Made with Improved Polycrystalline Silicon Wafers
MoS2, MoSe2, WS2 and WSe2 Thin Films for Photovoltaics
Textured Thin Films of Transition Metal Dichalcogenides for Potential Application in Photoelectrochemical Solar Cells
Electrooptical and Structural Properties of Polycrystalline CdTe Thin Films for Solar Cells
Growth Mechanism and Properties of Chemically Deposited Cadmium Sulfide Thin Films
Characterization of CuInSe2 Absorber Thin Films Grown by Metal Organic Chemical Vapor Deposition
Physical Vapor Deposition of CuInX2 (X = S, Se) Thin Films: A Model for the Growth Mechanism
Effect of Annealing in a Selenium Atmosphere on the Properties of Flash Evaporated CuInSe2 Polycrystalline Thin Films
Effect of Heat Treatment on Electrical Properties of Polycrystalline CuInSe2 Thin Films Prepared by Two Methods
Physical Properties of Electrodeposited Copper Indium Diselenide Thin Films and Junction Realization
Polysilicon Technologies for Large Area Displays
Thermal Stability of Glass Substrates During Solid Phase Crystallisation of a-Si on Glass by Rapid Thermal Annealing
Polycrystalline Silicon Thin Film Transistors for Liquid Crystal Displays
Performance of Poly-Si Thin Film Transistors Fabricated by Excimer-Laser Annealing of SiH4- and Si2H6- Source Low Pressure Vapor Deposited a-Si Films with or without Solid-Phase Crystallization
Modelling and Optimisation of Poly-Si Thin Film Transistors for Flat Panel Displays
Bulk and Interface States in Polycrystalline Silicon Thin Film Transistors
Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors
Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
Photoconductivity Peculiarities in CdSe Field Transistor Layer