Analog and Mixed Signal Test

A Recent History
1. Auflage 2021
ISBN: 978-3-319-21181-7
Verlag: Springer-Verlag GmbH

Buch, Englisch, 75 Seiten, Book, Format (B × H): 155 mm x 235 mm

Reihe: SpringerBriefs in Electrical and Computer Engineering

This book serves as a “go-to” guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip.  The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.

Zielgruppe

Research

Autoren/Hrsg.

Sindia, Suraj

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung

Inhaltsverzeichnis

Introduction to Analog and Mixed-Signal test.- Analog and mixed-signal test equipment.- Design-for-test techniques for AMS-IC.- Alternate test.- Yield and test cost optimization.- Emerging test methods.

Über Autor(innen)

Suraj Sindia is a Q&R Engineering Manager at Intel Corporation, in Hilsboro, Oregon.