Quantum Metrology, Imaging, and Communication

Softcover Nachdruck of the original 1. Auflage 2017
ISBN: 978-3-319-83540-2
Verlag: Springer International Publishing

Buch, Englisch, 273 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 441 g

Reihe: Quantum Science and Technology

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Zielgruppe

Graduate

Autoren/Hrsg.

Simon, David S.

Sergienko, Alexander V.

Jaeger, Gregg

Fachgebiete

• Naturwissenschaften Physik Quantenphysik
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie

Inhaltsverzeichnis

Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

Über Autor(innen)

David Simon. Professor, Stonehill College, Easton MA 02357, USA 

Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA

Alexander V. Sergienko, Boston University, Boston MA 02215, USA