Sengupta / Dasgupta / Singh VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Erscheinungsjahr 2019
ISBN: 978-981-329-767-8
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 1066, 775 Seiten, eBook

Reihe: Communications in Computer and Information Science

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Zielgruppe

Research

Autoren/Hrsg.

Sengupta, Anirban

Dasgupta, Sudeb

Singh, Virendra

Sharma, Rohit

Kumar Vishvakarma, Santosh

Inhaltsverzeichnis

Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.