Buch, Englisch, 354 Seiten, Format (B × H): 170 mm x 244 mm, Gewicht: 648 g
Buch, Englisch, 354 Seiten, Format (B × H): 170 mm x 244 mm, Gewicht: 648 g
Reihe: Computational Microelectronics
ISBN: 978-3-7091-7334-3
Verlag: Springer
From the reviews: "... this is a well produced book, written in a easy to read style, and will also be a very useful primer for someone starting out the field […], and a useful source of reference for experienced users ..." Microelectronics Journal
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
- Technische Wissenschaften Technik Allgemein Technik: Allgemeines
- Technische Wissenschaften Technik Allgemein Mathematik für Ingenieure
Weitere Infos & Material
1 Simulation of Silicon Devices: An Overview.- 1.1 Transport Models.- 1.2 Review of Physical Models for Drift-Diffusion Equations.- 1.3 Simulation Example: Gated Diode.- References.- 2 Mobility Model for Hydrodynamic Transport Equations.- 2.1 Analytical Model of the Electron Mobility.- 2.2 Parameter Fit and Comparison with Experimental Data.- 2.3 Hole Mobility.- 2.4 Simulation Results.- References.- 3 Advanced Generation-Recombination Models.- 3.1 Band-to-Band Tunneling.- 3.2 Defect-Assisted Tunneling.- 3.3 Numerical Simulation of Tunnel Generation Currents.- 3.4 Coupled Defect-Level Recombination.- References.- 4 Metal-Semiconductor Contact.- 4.1 Emission Current Through a Parabolic Barrier.- 4.2 Interpolation Scheme for the Transmission Probability.- 4.3 Analytical Model of the Contact Current.- 4.4 Boundary Conditions for Device Simulation.- 4.5 Comparison with Measurements.- 4.6 Results of Numerical Simulation.- References.- 5 Modeling Transport Across Thin Dielectric Barriers.- 5.1 One-Step Tunneling.- 5.2 Two-Step Multiphonon-Assisted Tunneling.- 5.3 Resonant Tunneling.- 5.4 Comparison of Two-Step Zero-Phonon Tunneling and Resonant Tunneling.- 5.5 Simulation of the Long-Term Charge Loss in EPROMs.- References.- 6 Summary and Outlook.- References.- Appendices.- B Evaluation of a Double Integral.- C Transmission Probability for a Parabolic Barrier.- D Asymptotic Forms and Interpolation of Cylinder Functions.- E Energy Limit for Gaussian Approximation.- G Probability of Resonant Tunneling.- References.- List of Figures.- List of Tables.
