Reimer Transmission Electron Microscopy

Physics of Image Formation and Microanalysis
4th Auflage 1997
ISBN: 978-3-662-14824-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 36, 587 Seiten, eBook

Reihe: Springer Series in Optical Sciences

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Zielgruppe

Research

Autoren/Hrsg.

Reimer, Ludwig

Inhaltsverzeichnis

1. Introduction.- 2. Particle Optics of Electrons.- 3. Wave Optics of Electrons.- 4. Elements of a Transmission Electron Microscope.- 5. Electron—Specimen Interactions.- 6. Scattering and Phase Contrast for Amorphous Specimens.- 7. Theory of Electron Diffraction.- 8. Electron Diffraction Modes and Applications.- 9. Imaging of Crystalline Specimens and Their Defects.- 10. Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy.- 11. Specimen Damage by Electron Irradiation.- References.