Piraux | Electron and Photon Impact Ionization and Related Topics 2004 | Buch | 978-0-7503-1009-3 | sack.de

Buch, Englisch, 198 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 482 g

Reihe: Institute of Physics Conference Series

Piraux

Electron and Photon Impact Ionization and Related Topics 2004

Proceedings of the International Conference Louvain-la-Neuve, 1-3 July 2004
1. Auflage 2005
ISBN: 978-0-7503-1009-3
Verlag: CRC Press

Proceedings of the International Conference Louvain-la-Neuve, 1-3 July 2004

Buch, Englisch, 198 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 482 g

Reihe: Institute of Physics Conference Series

ISBN: 978-0-7503-1009-3
Verlag: CRC Press


Electron and Photon Impact Ionization and Related Topics 2004 provides an overview of the latest advances in the field of ionization by electron and photon impact. The book contains 18 contributions of recent experimental, theoretical, and computational work on correlated processes that involve a wide range of targets, including atoms, molecules, clusters, and surfaces. It covers a broad range of current topics, such as multi-particle coincidence studies, in particular, (e,2e) and (e,3e) processes, photoionization with or without excitation, and multiphoton single and double ionization. Three chapters contain the following topics: anisotropy and polarization in Auger-electron emission, multiple ionization of atoms in strong fields, and theoretical and practical aspects of photoionization with excitation. Because of the extensive array of applications discussed, this book is an essential reference for chemists, biologists, and researchers working in atomic, molecular, cluster, and surface physics.

Piraux Electron and Photon Impact Ionization and Related Topics 2004 jetzt bestellen!

Zielgruppe


Professional


Autoren/Hrsg.


Weitere Infos & Material


Identification of double ionization mechanisms, results bearing on electron correlation measurements; Electron excitation & ionization of 40 Ca at low energy; Role of the ground state in (e,3e) processes on helium; Modern studies of anisotropy and polarization in Auger-electron emission; Coherence effects in Auger-photoelectrons coincidence experiments; Correlations in the Auger process under electron impact ionisation of Argon; Doppler-free resonant Auger Raman spectroscopy on atoms and molecules at SPring-8; Interference effects in ionization of H 2 targets by fast electron impact; Quasi-elastic scattering of electrons at large momentum transfer; Multiple ionization in strong fields; Complete experiments in photoionization with excitation: Theory and Practice; Double photoionisation of molecules via TOF electron-electron coincidence experiments; Simultaneous versus sequential two-photon double electron ejection from He ?; Multiple photoionization of atoms and ions using the time-dependent close-coupling method; Ab initio Double Photoionization Cross Sections For Helium Down To Threshold; On the Green function for two charged particles in the presence of a Coulomb center of force; Interaction of strong X-ray lasers with small argon clusters; Electron impact detachment of small negative clusters




Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.