Pelleg Mechanical Properties of Nanomaterials

1. Auflage 2021
ISBN: 978-3-030-74652-0
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 520 Seiten, eBook

Reihe: Engineering Materials

This book highlights the mechanical properties of nanomaterials produced by several techniques for various applications. The dislocations observed in specimens obtained in nanomaterials are discussed on the chapter about deformation process. Partial dislocations and grain boundary sliding deformation phenomena in nanomaterial specimens are also deeply discussed.  Tests for tension, compression, and hardness are described.  The behavior of nanomaterials is compared to macrosize specimens, and the results obtained for different fabrication methods are also compared. The special characteristics of nanomaterials are summarized at the end of the book.

Zielgruppe

Research

Autoren/Hrsg.

Pelleg, Joshua

Inhaltsverzeichnis

What are nanomaterials.- Structure of nanomaterials.- Basic concepts for producing nanomaterials.- Imperfections in nanomaterial.- Static deformation.- Dynamic deformation.

Über Autor(innen)

Joshua Pelleg received his B.S. in Chemical Engineering Technion Institute of Technology, Haifa, Israel, M.S. in Metallurgy, Illinois Institute of Technology, Chicago, IL, USA, and Ph.D. in Metallurgy, University of Wisconsin, Madison, WI. He is affiliated with Ben Gurion University of the Negev, Materials Engineering Department, Beer Sheva, Israel, since 1970, being among the departments’ founders and its second chairman. He has taught ever since the subjects of mechanical properties of materials, diffusion in solids and defects in solids. He has chaired several university committees and served four terms as the Chairman of Advanced Studies in Ben Gurion University. Professor Pelleg was the recipient of the Samuel Ayrton chair in Metallurgy. His current research interests are mechanical properties of materials, diffusion in solids, thin film deposition, and properties and characterization of thin films.