Process-Aware SRAM Design and Test
E-Book, Englisch, Band 40, 194 Seiten, eBook
Reihe: Frontiers in Electronic Testing
ISBN: 978-1-4020-8363-1
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
Pavlov / Sachdev
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies jetzt bestellen!
covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
and Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.
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