Pavese / Forbes Data Modeling for Metrology and Testing in Measurement Science
1. Auflage 2008
ISBN: 978-0-8176-4804-6
Verlag: Birkhäuser Boston
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, 486 Seiten, Web PDF
Reihe: Mathematics and Statistics (R0)
ISBN: 978-0-8176-4804-6
Verlag: Birkhäuser Boston
Format: PDF
Kopierschutz: 1 - PDF Watermark
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods described in standard texts. The focus is on techniques having a broad range of real-world applications in a variety of fields.
Data Modeling for Metrology and Testing in Measurement Science may be used as a textbook in graduate courses on data modeling and computational methods, or as a training manual in the fields of calibration and testing. The book will also serve as an excellent reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
An Introduction to Data Modeling Principles in Metrology and Testing.- Probability in Metrology.- Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty.- Interval Computations and Interval-Related Statistical Techniques: Tools for Estimating Uncertainty of the Results of Data Processing and Indirect Measurements.- Parameter Estimation Based on Least Squares Methods.- Frequency and Time#x2014;Frequency Domain Analysis Tools in Measurement.- Data Fusion, Decision-Making, and Risk Analysis: Mathematical Tools and Techniques.- Comparing Results of Chemical Measurements: Some Basic Questions from Practice.- Modelling of Measurements, System Theory and Uncertainty Evaluation.- Approaches to Data Assessment and Uncertainty Estimation in Testing.- Monte Carlo Modeling of Randomness.- Software Validation and Preventive Software Quality Assurance for Metrology.- Virtual Istrumentation.- Internet-Enabled Metrology.




