Buch, Englisch, 976 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 17948 g
7th International Workshop on Advanced Optical Imaging and Metrology
Buch, Englisch, 976 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 17948 g
ISBN: 978-3-642-36358-0
Verlag: Springer
- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions,multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)
Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology.- Application-driven technologies in Optical Imaging and Metrology.- High-dynamic range solutions in Optical Imaging and Metrology.- Hybrid technologies in Optical Imaging and Metrology.- New optical sensors, imaging and measurement systems.