On-Line Testing for VLSI

Nachdrucked from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2. Softcover version of original hardcover Auflage 1998
ISBN: 978-1-4419-5033-8
Verlag: Springer

Buch, Englisch, 160 Seiten, Previously published in hardcover, Format (B × H): 178 mm x 254 mm, Gewicht: 322 g

Reihe: Frontiers in Electronic Testing

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as . In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent . Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
is an edited volume of original research comprising invited contributions by leading researchers.

Zielgruppe

Research

Autoren/Hrsg.

Nicolaidis, Michael

Zorian, Yervant

Pradhan, Dhiraj

Fachgebiete

• Technische Wissenschaften Technik Allgemein Konstruktionslehre und -technik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Technik Allgemein Computeranwendungen in der Technik
• Mathematik | Informatik EDV | Informatik Angewandte Informatik Computeranwendungen in Wissenschaft & Technologie
• Geisteswissenschaften Design Produktdesign, Industriedesign
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien
• Mathematik | Informatik EDV | Informatik Informatik
• Mathematik | Informatik EDV | Informatik Professionelle Anwendung Computer-Aided Design (CAD)

Inhaltsverzeichnis

1: Introduction.- 1.1. On-Line Testing for VLSI—A Compendium of Approaches.- 2: Self-Checking Design.- 2.1. On-Line Fault Monitoring.- 2.2. Efficient Totally Self-Checking Shifter Design.- 2.3. A New Design Method for Self-Checking Unidirectional Combinational Circuits.- 2.4. Concurrent Delay Testing in Totally Self-Checking Systems.- 3: Self Checking Checkers.- 3.1. Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters.- 3.2. Self-Testing Embedded Two-Rail Checkers.- 4: On-Line Monitoring of Reliability Indicators.- 4.1. Thermal Monitoring of Self-Checking Systems.- 4.2. Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures.- 4.3. Clocked Dosimeter Compatible with Digital CMOS Technology.- 5: Built-In Self-Test.- 5.1. Scalable Test Generators for High-Speed Datapath Circuits.- 5.2. Mixed-Mode BIST Using Embedded Processors.- 5.3. A BIST Scheme for Non-Volatile Memories.- 6: Fault Tolerant Systems.- 6.1. On-Line Fault Resilience Through Gracefully Degradable ASICs.- 6.2. Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components.