Nelson Applied Life Data Analysis

1. Auflage 2005
ISBN: 978-0-471-72522-0
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 656 Seiten, E-Book

Reihe: Wiley Series in Probability and Statistics

WILEY-INTERSCIENCE PAPERBACK SERIES
The Wiley-Interscience Paperback Series consists of selectedbooks that have been made more accessible to consumers in an effortto increase global appeal and general circulation. With these newunabridged softcover volumes, Wiley hopes to extend the lives ofthese works by making them available to future generations ofstatisticians, mathematicians, and scientists.
"Many examples drawn from the author's experience ofengineering applications are used to illustrate the theoreticalresults, which are presented in a cookbook fashion...it provides anexcellent practical guide to the analysis of product-lifedata."
-T.M.M. Farley
Special Programme of Research in Human Reproduction
World Health Organization
Geneva, Switzerland
Review in Biometrics, September 1983
Now a classic, Applied Life Data Analysis has been widelyused by thousands of engineers and industrial statisticians toobtain information from life data on consumer, industrial, andmilitary products. Organized to serve practitioners, this bookstarts with basic models and simple informative probability plotsof life data. Then it progresses through advanced analyticalmethods, including maximum likelihood fitting of advanced models tolife data. All data analysis methods are illustrated with numerousclients' applications from the author's consulting experience.

Autoren/Hrsg.

Nelson, Wayne B.

Inhaltsverzeichnis

Preface to the Paperback Edition.
Preface.
About the Author.
1. Overview and Background.
2. Basic Concepts and Distributions for Product Life.
3. Probability Plotting of Complete and Singly CensoredData.
4. Graphical Analysis of Multiply Censored Data.
5. Series Systems and Competing Risks.
6. Analysis of Complete Data.
7. Linear Methods for Singly Censored Data.
8. Maximum Likelihood Analysis of Multiply Censored Data.
9. Analyses of Inspection Data (Qualtal-Response and IntervalData).
10. Comparisons (Hypothesis Tests) For Complete Data.
11. Comparisons with Linear Estimators (Singly Censored andComplete Data).
12. Maximum Likelihood Comparisons (Multiply Censored and OtherData).
13. Survey of Other Topics.
Appendix A. Tables..
References.
Index.

Über Autor(innen)

DR. WAYNE NELSON IS AWARDED THE SHEWHART MEDAL
American Society for Quality awarded Dr. Wayne Nelson ofSchenectady, New York the 2003 Shewhart Medal. The Medal honors hisoutstanding technical leadership, particularly for innovativedevelopments and applications of theory and methods for analyzingquality, reliability, and accelerated test data, and for widelydisseminating such developments through his books and manypublications, talks, and courses.
The Shewhart Medal for outstanding technical leadership is namedafter Dr. Walter A. Shewhart, who pioneered statistical methods forcontrolling and improving the quality of manufactured products.These methods contributed significantly to the United States' wareffort in World War II. Subsequently taken to Japan by Dr. W.Edwards Deming, these methods revolutionized Japan's industries.Today these methods are part of widely used Six Sigma training onhow to improve the quality of products and services.
The American Society for Quality is the world's largestprofessional society dedicated to the improved quality of productsand services. It serves its members and the public through avariety of educational activities, including conferences, trainingcourses, journals, and books.
Dr. Nelson is a graduate of the California Institute ofTechnology (Caltech) and the Univiversity of Illinois. Formerlywith GE Research & Development, he now privately consults andgives courses for companies, professional societies, anduniversities. For his technical contributions, he was elected aFellow of the American Society for Quality, the AmericanStatistical Association, and the Institute of Electrical andElectronic Engineers. He recently spent four months in Argentina ona Fulbright Award, lecturing on analysis of product reliabilitydata.