Nelson Accelerated Testing

Statistical Models, Test Plans, and Data Analysis
1. Auflage 2009
ISBN: 978-0-470-31747-1
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 616 Seiten, E-Book

Reihe: Wiley Series in Probability and Statistics

The Wiley-Interscience Paperback Series consists of selected booksthat have been made more accessible to consumers in an effort toincrease global appeal and general circulation. With these newunabridged softcover volumes, Wiley hopes to extend the lives ofthese works by making them available to future generations ofstatisticians, mathematicians, and scientists.
". . . a goldmine of knowledge on accelerated life testingprinciples and practices . . . one of the very few capable ofadvancing the science of reliability. It definitely belongs inevery bookshelf on engineering."
-Dev G. Raheja, Quality and Reliability EngineeringInternational
". . . an impressive book. The width and number of topicscovered, the practical data sets included, the obvious knowledgeand understanding of the author and the extent of publishedmaterials reviewed combine to ensure that this will be a book usedfrequently."
-Journal of the Royal Statistical Society
A benchmark text in the field, Accelerated Testing: StatisticalModels, Test Plans, and Data Analysis offers engineers, scientists,and statisticians a reliable resource on the effective use ofaccelerated life testing to measure and improve productreliability. From simple data plots to advanced computer programs,the text features a wealth of practical applications and a clear,readable style that makes even complicated physical and statisticalconcepts uniquely accessible. A detailed index adds to its value asa reference source.

Autoren/Hrsg.

Nelson, Wayne B.

Inhaltsverzeichnis

Preface.
1. Introduction and Background.
2. Models for Life Tests with Constant Stress.
3. Graphical Data Analysis.
4. Complete Data and Least Squares Analyses.
5. Censored Data and Maximum Likelihood Methods.
6. Test Plans.
7. Competing Failure Modes and Size Effect.
8. Least-Squares Comparisons for Complete Data.
9. Maximum Likelihood Comparisons for Censored and OtherData.
10. Models and Data Analyses for Step and Varying Stress.
11. Accelerated Degradation.
Appendix A. Statistical Tables.
References.
Index.

Über Autor(innen)

WAYNE B. NELSON, PhD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association.