Em Material Characterization Techniques for Metamaterials

2018. Auflage 2017
ISBN: 978-981-10-6516-3
Verlag: Springer Nature Singapore

Buch, Englisch, 50 Seiten, Format (B × H): 156 mm x 241 mm, Gewicht: 1299 g

Reihe: SpringerBriefs in Electrical and Computer Engineering

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail.

Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects.

The book provides a valuable resource for researchers working in the field of metamaterials

Zielgruppe

Research

Autoren/Hrsg.

Nair, Raveendranath U

Dutta, Maumita

P S, Mohammed Yazeen

Venu, K S

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik

Inhaltsverzeichnis

1.            Introduction                                                                                                      

2.            Basics of Material Characterization                                                          

2.1          Non-Resonant Methods                                                                              

2.2          Resonant Method                                                                                          

3.            EM Material Characterization Techniques                                            

3.1          Waveguide based Methods                                                       

3.1.1      Waveguide-based transmission/             

Reflection measurement technique       

3.1.2      Waveguide-based retrieval method                       

3.1.3      Waveguide verification design procedure

3.1.4      An estimated method for resolving

 permittivity and permeability values

accuracy problem near ?/2

resonances in Transmission/Reflection

Technique

3.2          Strip Line Methods  &n

bsp;                                                       3.2.1      Microstrip line method                                 

3.2.2      Measurement technique for microstrip

circuit application                                            

3.2.3   &nb

sp;  Strip Line Fixture Method                            3.2.4      Asymmetrical Stripline Method                

3.2.5      Adjustable height stripline method        

3.3          Free Space Methods                                                     

3.3.1      Synthetic Gaussian aperture based non-

invasiv

e metamaterial characterization system                                                                

3.4          Miscellaneous Methods                                                                              

3.4.1      Waveguide input impedance method                   

3.4.2      Q-based methods for resonant metamaterials

4.            Summary                                                                                            

References             

               

Subject Index    

Über Autor(innen)

Dr Raveendranath U. Nair is currently Senior Principal Scientist and Head at the Centre for Electromagnetics (CEM), CSIR-National Aerospace Laboratories (CSIR-NAL), Bangalore, India. Dr R U Nair has authored/co-authored over 150 research publications including peer-reviewed journal papers, symposium papers and technical reports. He has co-authored a chapter in a book “Sensors Update” published by Wiley-VCH, Germany, in 2000. The electromagnetic (EM) material characterization techniques developed for his doctoral work were included in the section “Perturbation Theory” in “RF and Microwave Encyclopaedia” (Vol. 4) published by John Wiley & Sons, USA in 2005. Dr. Nair received the CSIR-NAL Excellence in Research Award (2007–2008) for his contributions to the EM design of variable thickness airborne radomes. His research interests include electromagnetic (EM) design and performance analysis of radomes, radar cross-section, frequency selective surfaces (for radomes and radar absorbing structures (RAS)), EM material characterization, complex media electromagnetics and microwave measurements. He took key responsibilities in the setting up of three major national facilities (Adaptive Antenna Facility, Frequency selective surface (FSS) Characterization Facility, and Electromagnetic Materials Applications Facility) at CEM, CSIR-NAL, Bangalore. He is a life member of the Aeronautical Society of India (AeSI), member of the Indian Society for Advancement of Materials and Processing Engineering (ISAMPE) and member of the Institute of Electrical and Electronics Engineers (IEEE). Dr R U Nair is also a Professor in the Academy of Scientific and Innovative Research (AcSIR), New Delhi.

Ms. Maumita Dutta obtained her M.Tech in radio frequency (RF) and Microwave Engineering from R.V. College of Engineering, Visvesvaraya Technological University, Bangalore, India. She obtained her B.Tech (ECE) Degree in 2012 from ICFAI University, Tripura. She is a Project Scientist at the Centre for Electromagnetics (CEM) of CSIR-National Aerospace Laboratories, Bangalore and her working areas include metamaterials and material characterization.

Mohammed Yazeen P.S. has been working as a Project Scientist with the Centre for Electromagnetics (CEM) of CSIR-National Aerospace Laboratories (CSIR-NAL), Bangalore, India, since February 2015. He was born in 1990 at Kerala, India. Mohammed Yazeen P.S. obtained his M.Tech. degree in Electronics with specialization in Wireless Technology from Cochin University of Science and Technology (CUSAT), Cochin, India in 2014. His research interests are design and analysis of streamlined airborne radomes, wireless communication, structurally integrated radiating structures and electromagnetic (EM) material characterization.

Mr. K. S. Venu is currently Senior Technical Officer at the Centre for Electromagnetics (CEM), CSIR-National Aerospace Laboratories (CSIR-NAL), Bangalore, India. He received the B.E (Electronics & Communi

cation) degree from Bangalore University, Karnataka, India, in 2001. He has authored/co-authored over 30 research publications including journal papers and technical reports. His research interests include electromagnetic design and performance analysis of radomes, frequency selective surfaces (for radomes and radar absorbing structures (RAS)), electromagnetic (EM) material characterization, complex media electromagnetics and microwave measurements. He took key responsibilities in the setting up of three major national facilities (Adaptive Antenna Facility, Frequency selective surface (FSS) Characterization Facility, and Electromagnetic Materials Applications Facility) at CEM, CSIR-NAL, Bangalore. He is a life member of the Indian Society for Advancement of Materials and Processing Engineering (ISAMPE).