Design for AT-Speed Test, Diagnosis and Measurement

2000
ISBN: 978-0-7923-8669-8
Verlag: Springer US

Buch, Englisch, Band 15, 239 Seiten, HC runder Rücken kaschiert, Format (B × H): 183 mm x 260 mm, Gewicht: 1570 g

Reihe: Frontiers in Electronic Testing

is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

Zielgruppe

Research

Autoren/Hrsg.

Nadeau-Dostie, Benoit

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien

Inhaltsverzeichnis

Technology Overview.- Memory Test and Diagnosis.- Logic Test and Diagnosis.- Embedded Test Design Flow.- Hierarchical Core Test.- Test and Measurement for PLLs and ADCs.- System Test and Diagnosis.- System Reuse of Embedded Test.