Mulvey / Sheppard Advances in Optical and Electron Microscopy

1. Auflage 2013
ISBN: 978-1-4832-8800-0
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band Volume 12, 376 Seiten, Web PDF

Reihe: Advances in Optical and Electron Microscopy

The volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and industrial inspection.

Autoren/Hrsg.

Mulvey, T.

Sheppard, Charles

Inhaltsverzeichnis

1;Front Cover;1
2;Advances in Optical and Electron Microscopy;4
3;Copyright Page ;5
4;Contributors;6
5;Preface;8
6;Table of Contents;10
7;Chapter 1. The Invention of the Electron Fresnel Interference Biprism;14
7.1;I. Childhood years in Bielefeld;14
7.2;II. Gaining technical know-how as a student apprentice;15
7.3;III. A broad education in physics with Professor Walter Kossel;15
7.4;IV. Influence of the work of kikuchi and convergent beam diffraction;16
7.5;V. Electron-optical experiments with Brüche, Scherzer and Mahl;18
7.6;VI. Quantitative testing of the operation of the biprism;25
7.7;VII. Measurement of the inner potential of solids;32
7.8;VIII. Electron interference microscope in the transmission mode;34
7.9;IX. The intensity problem in electron interferometers;34
7.10;X. Atomic resolution electron holography;34
8;Chapter 2. Electron Image Plane Off-axis Holography of Atomic Structures;38
8.1;I. Introduction;38
8.2;II. Principles of off-axis image plane electron holography;46
8.3;III. Performance of image plane electron holography;54
8.4;IV. Influence of the lens aberrations in the high-resolution domain;73
8.5;V. Reconstruction of the image wave and correction of aberrations;82
8.6;VI. Experimental realization of holography of atomic structures;84
8.7;VII. Conclusion;97
8.8;References;103
9;Chapter 3. Magnetic Through-the-lens Detection in Electron Microscopy and Spectroscopy, Part 1;106
9.1;I. Introduction;106
9.2;II. Historical development of through-the-lens detection;109
9.3;III. Historical development of the magnetic parallelizer for spectroscopy applications;126
9.4;IV. Theory of adiabatic motion;132
9.5;V. Summary;147
9.6;References;148
10;Chapter 4. Advances in Voltage-Contrast Detectors in Scanning Electron Microscopes;152
10.1;I. Introduction;153
10.2;II. Test techniques for integrated circuits;153
10.3;III. Secondary electrons;168
10.4;IV. Voltage-contrast detectors;195
10.5;V. Design of a double channel spectrometer;204
10.6;VI. Measurements;229
10.7;VII. Future developments;247
10.8;VIII. Conclusions;248
10.9;IX. List of symbols;250
10.10;Acknowledgements;250
10.11;References;251
11;Chapter 5. Scanning Near-field Optical Microscopy (SNOM);256
11.1;I. Introduction;256
11.2;II. Historical background;260
11.3;III. Theoretical background;265
11.4;IV. Experimental work;285
11.5;V. DISCUSSION;319
11.6;Acknowledgements;322
11.7;References;322
12;Chapter 6. Microscopic Thermal Wave Non-destructive Testing;326
12.1;I. Introduction;326
12.2;II. Thermal waves and their generation;328
12.3;III. The resolution of the thermal wave microscope;334
12.4;IV. Photothermal NDE techniques with periodic heating;338
12.5;V. Photothermal pulse and scanning methods;351
12.6;VI. Experimental pulse techniques;358
12.7;VII. Conclusion;365
12.8;References;369
13;INDEX;374