E-Book, Englisch, Band 3, 159 Seiten, eBook
Reihe: Microsystems
Minne / Manalis / Quate Bringing Scanning Probe Microscopy up to Speed
1999
ISBN: 978-1-4615-5167-6
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, Band 3, 159 Seiten, eBook
Reihe: Microsystems
ISBN: 978-1-4615-5167-6
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Introduction. Preface. 1. Improving Convention Scanning Probe Microscopes. 2. Design of Piezoresistive Cantilevers with Integrated Actuators. 3. Increasing the Speed of Imaging. 4. Cantilevers with Interdigital Deflection Sensors. 5. Operation of the Interdigital Cantilever. 6. Cantilever Arrays. 7. Scanning Probes for Information Storage and Retrieval. 8. Silicon Process Flow: ZnO Actuator and Piezoresistive Sensor. 9. Silicon Process Flow: Interdigital Cantilever.




