Acoustic Scanning Probe Microscopy

2013
ISBN: 978-3-642-43079-4
Verlag: Springer

Buch, Englisch, 494 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 7781 g

Reihe: NanoScience and Technology

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Zielgruppe

Research

Autoren/Hrsg.

Marinello, Francesco

Savio, Enrico

Passeri, Daniele

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Technik Allgemein Nanotechnologie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Quantenphysik Atom- und Molekülphysik

Inhaltsverzeichnis

From the contents: Overview of acoustic techniques.- Contact dynamics modelling.- Cantilever dynamics: theoretical modeling.- Finite elements modelling.- AFAM calibration.- Enhanced sensitivity.- UAFM.- Holography calibration.- UFM.- Friction/lateral techniques.- Harmonix.- Scanning microdeformation microscopy (SMM).- Tip wear.- Comparison with other techniques.- Applications polymer.- Thin films.