Lutz Semiconductor Radiation Detectors

Device Physics
1. Auflage 1999. 2. printing 2007
ISBN: 978-3-540-71679-2
Verlag: Springer Berlin Heidelberg
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 283 Seiten

Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.

Autoren/Hrsg.

Lutz, Gerhard

Inhaltsverzeichnis

1;Preface;5
2;Contents;7
3;1 Introduction;12
4;2 Semiconductors;16
4.1;2.1 Crystal Structure;16
4.2;2.2 Energy Bands;17
4.3;2.3 Intrinsic Semiconductors;20
4.4;2.4 Extrinsic Semiconductors;23
4.5;2.5 Carrier Transport in Semiconductors;25
4.6;2.6 Carrier Generation and Recombination in Semiconductors;30
4.7;2.7 Simultaneous Treatment of Carrier Generation and Transport;43
4.8;2.8 Summary and Discussion;46
5;3 Basic Semiconductor Structures;48
5.1;3.1 The p–n Diode Junction;48
5.2;3.2 Metal–Semiconductor Contact;65
5.3;3.3 Metal–Insulator–Semiconductor Structure;68
5.4;3.4 The n+-n or p+-p Structures;81
5.5;3.5 Summary and Discussion;82
6;4 Semiconductors as Detectors;86
6.1;4.1 The Properties of Intrinsic Semiconductor Materials;86
6.2;4.2 Properties of Extrinsic Semiconductor Materials;90
6.3;4.3 Insulators and Metals;95
6.4;4.4 Choice of Detector Material;98
7;5 Detectors for Energy;101
7.1;5.1 Unbiased Diode;101
7.2;5.2 Reverse-Biased Diode;106
7.3;5.3 Summary;113
8;6 Detectors for Position;115
8.1;6.1 Resistive Charge Division;115
8.2;6.2 Diode Strip Detectors;116
8.3;6.3 Strip Detectors with Double-Sided Readout;122
8.4;6.4 Strip Detectors with Integrated Capacitive Readout Coupling;126
8.5;6.5 Drift Detectors;131
8.6;6.6 Charge Coupled Devices as Detectors;143
8.7;6.7 Summary;157
9;7 The Electronics of the Readout Function;159
9.1;7.1 Operating Principles of Transistors;159
9.2;7.2 Noise Sources;186
9.3;7.3 The Measurement of Charge;196
9.4;7.4 Basic Electronic Circuits;201
9.5;7.5 Integrated Circuit Technologies;209
9.6;7.6 Integrated Circuits for Strip Detectors;213
9.7;7.7 Integrated Circuits for Pixel Detectors;216
9.8;7.8 Noise in Strip Detectors – Front-End Systems;217
9.9;7.9 Summary;231
10;8 The Integration of Detectors;234
10.1;8.1 Hybrid Systems of Detectors and Their Electronics;234
10.2;8.2 Detector-Technology-Compatible Electronics;238
11;9 Detectors with Intrinsic Amplification;244
11.1;9.1 Avalanche Diode;244
11.2;9.2 Depleted Field Effect Transistor Structure;248
11.3;9.3 DEPFET Pixel Detectors;259
12;10 Detector Technology;264
12.1;10.1 Production of Detector Substrates;264
12.2;10.2 Processing Sequence in Planar Technology;265
12.3;10.3 Technology Simulation;271
13;11 Device Stability and Radiation Hardness;272
13.1;11.1 Electrical Breakdown and Protection;272
13.2;11.2 Radiation Damage in Semiconductors;280
13.3;11.3 Radiation Damage in the Surface Region;306
13.4;11.4 Radiation Damage in Detectors;308
13.5;11.5 Radiation Damage in Electronics;312
13.6;11.6 Radiation Hardening Techniques;314
13.7;11.7 Summary;315
14;12 Device Simulation;317
14.1;12.1 Mathematical Formulation;317
14.2;12.2 Numerical Solution of Stationary Situations;323
14.3;12.3 Simulation of Time-Dependent Situations;334
15;Appendix A;337
16;Frequently Used Symbols;337
17;Appendix B;340
18;Physical Constants;340
19;References;341
19.1;Books and Reviews;341
19.2;Articles;342
20;Index;348