Buch, Englisch, 204 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 359 g
Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Buch, Englisch, 204 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 359 g
ISBN: 978-1-4899-8594-1
Verlag: Springer
Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Introduction.- Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems.- Electromagnetic Compatibility; Power Integrity.- Dependable System Technology.