Defect Prevention

Use of Simple Statistical Tools
1. Auflage 1989
ISBN: 978-0-8247-7887-3
Verlag: Taylor & Francis Inc

Buch, Englisch, 710 Seiten, Format (B × H): 182 mm x 259 mm, Gewicht: 1430 g

Reihe: Quality and Reliability

This book discusses statistical process control (SPC) concepts, emphasizing the need to establish stability of work processes. It gives the elements required to develop a defect prevention system (DPS), and integrates the application of process control and problem analysis tools.

Zielgruppe

Professional Practice & Development

Autoren/Hrsg.

Kane

Fachgebiete

• Wirtschaftswissenschaften Betriebswirtschaft Management Qualitätsmanagement, Qualitätssicherung (QS), Total Quality Management (TQM)
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Verfahrenstechnik, Chemieingenieurwesen
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle

Inhaltsverzeichnis

Basic Concepts of Process Control Defect Prevention Concepts Process Definition and Measurement Problems Control Charts Problems Control Chart Sampling Concepts and Applications Problems Histograms Problems Interpretation of Control Charts Problems Process Capability Problems Simple Problem Analysis Tools Check Sheets Pareto Diagrams Problems Stratification and Graphs Problems Comparision Methods Problems Scatter Plots Problems Cause-and-Effect Diagrams and Problem Solving Defect Prevention System Building a Defect Prevention System Selected Bibliography Appendix I: Gage Evaluation Appendix II: Geometric Dimensioning and Tolerancing Appendix III: Tables

Über Autor(innen)

Kane\,