Jespers | The gm/ID Methodology, a sizing tool for low-voltage analog CMOS Circuits | E-Book | www2.sack.de
E-Book

E-Book, Englisch, 171 Seiten

Reihe: Analog Circuits and Signal Processing

Jespers The gm/ID Methodology, a sizing tool for low-voltage analog CMOS Circuits

The semi-empirical and compact model approaches
2010
ISBN: 978-0-387-47101-3
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

The semi-empirical and compact model approaches

E-Book, Englisch, 171 Seiten

Reihe: Analog Circuits and Signal Processing

ISBN: 978-0-387-47101-3
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark



IC designers appraise currently MOS transistor geometries and currents to compromise objectives like gain-bandwidth, slew-rate, dynamic range, noise, non-linear distortion, etc. Making optimal choices is a difficult task. How to minimize for instance the power consumption of an operational amplifier without too much penalty regarding area while keeping the gain-bandwidth unaffected in the same time? Moderate inversion yields high gains, but the concomitant area increase adds parasitics that restrict bandwidth. Which methodology to use in order to come across the best compromise(s)? Is synthesis a mixture of design experience combined with cut and tries or is it a constrained multivariate optimization problem, or a mixture? Optimization algorithms are attractive from a system perspective of course, but what about low-voltage low-power circuits, requiring a more physical approach? The connections amid transistor physics and circuits are intricate and their interactions not always easy to describe in terms of existing software packages. The gm/ID synthesis methodology is adapted to CMOS analog circuits for the transconductance over drain current ratio combines most of the ingredients needed in order to determine transistors sizes and DC currents.

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Weitere Infos & Material


1;Foreword;7
2;Contents;10
3;Notations;14
4;Sizing the Intrinsic Gain Stage;16
4.1;1.1 The Intrinsic Gain Stage;16
4.2;1.2 The Intrinsic Gain Stage Frequency Response;16
4.3;1.3 Sizing the Intrinsic Gain Stage;18
4.4;1.4 The gm/ ID Sizing Methodology;22
4.5;1.5 Conclusions;23
5;The Charge Sheet Model Revisited;25
5.1;2.1 Why the Charge Sheet Model?;25
5.2;2.2 The Generic Drain Current Equation;25
5.3;2.3 The Charge Sheet Model Drain Current Equation;27
5.4;2.4 Common Source Characteristics;29
5.5;2.5 Weak Inversion Approximation of the Charge Sheet Model;32
5.6;2.6 The gm/ ID Ratio in the Common Source Configuration;34
5.7;2.7 Common Gate Characteristics of the Saturated Transistor;37
5.8;2.8 A Few Concluding Remarks Concerning the C.S.M.;38
6;Graphical Interpretation of the Charge Sheet Model;39
6.1;3.1 A Graphical Representation of ID;39
6.2;3.2 More on the VT Curve;42
6.3;3.3 Two Approximate Representations of VT;43
6.4;3.4 A Few Examples Illustrating the Use of the Graphical Construction;46
6.5;3.5 A Closer Look to the Pinch-Off Region;52
6.6;3.6 Conclusion;53
7;Compact Modeling;54
7.1;4.1 The Basic Compact Model;54
7.2;4.2 The E.K.V. Model;55
7.3;4.3 The Common Source Characteristics ID (VG);61
7.4;4.4 Strong andWeak Inversion Asymptotic Approximations Derived from the Compact Model;63
7.5;4.5 Checking the Compact Model Against the C.S.M.;63
7.6;4.6 Evaluation of gm/ ID;67
7.7;4.7 Sizing the Intrinsic Gain Stage by Means of the E. K. V. Model;68
7.8;4.8 The Common-Gate gms/ ID Ratio;70
7.9;4.9 An Earlier Compact Model;71
7.10;4.10 Modeling Mobility Degradation;72
7.11;4.11 Conclusion;79
8;The Real Transistor;80
8.1;5.1 Short Channel Effects;80
8.2;5.2 Checking the Validity of the Compact Model when its Parameters vary with the Source and Drain Voltages;82
8.3;5.3 Compact Model Parameters Versus Bias and Gate Length;89
8.4;5.4 Reconstructing ID (VDS) Characteristic;95
8.5;5.5 Evaluation of gx/ ID Ratios;97
8.6;5.6 Conclusions;104
9;The Real Intrinsic Gain Stage;105
9.1;6.1 The Dependence on Bias Conditions of the gm/ ID and gd/ ID Ratios ( MATLAB fig061. m);105
9.2;6.2 Sizing the I.G.S with "Semi-empirical" Data;106
9.3;6.3 Model Driven Sizing of the I.G.S.;116
9.4;6.4 Slew-Rate Considerations;123
9.5;6.5 Conclusions;124
10;The Common-Gate Configuration;125
10.1;7.1 Drain Current Versus Source-to-Substrate Voltage ( Matlab fig071. m);125
10.2;7.2 The Cascoded Intrinsic Gain Stage;127
11;Sizing the Miller Op. Amp.;132
11.1;8.1 Introductory Considerations;132
11.2;8.2 The Miller Op. Amp.;132
11.3;8.3 Sizing the Miller Operational Amplifier (MATLAB OpAmp. m);140
11.4;8.4 Conclusion;153
12;How to Utilize the Data available under "extras. springer. com";154
12.1;A1.1 Global Variables;154
12.2;A1.2 An Example Making Use of the "Semi-empirical" Data: The Evaluation of Drain Currents and gm/ ID Ratio Matrices ( MATLAB A12. m);155
12.3;A1.3 An Example Making Use of the E.K.V Global Variables: The Elaboration of an ID( VGS) Characteristic ( Matlab A13. m);157
13;The "MATLAB" Toolbox;160
13.1;A2.1 Charge Sheet Model Files;160
13.2;A2.2 Compact Model Files;162
13.3;A2.3 Other Functions;163
14;Temperature and Mismatch, from C.S.M. to E. K. V.;165
14.1;A3.1 The Influence of the Temperature on the Drain Current ( MATLAB A31. m);165
14.2;A3.2 The Influence of the Temperature on gm/ID ( Matlab A32. m);166
14.3;A3.3 Temperature Dependence of E.K.V Parameters ( MATLAB A33. m);168
14.4;A3.4 The Impact of Technological Mismatches on the Drain Current ( Matlab A34. m);169
14.5;A3.5 Mismatch and E.K.V Parameters (MATLAB A35.m);171
15;E.K.V. Intrinsic Capacitance Model;172
16;Bibliography;176
17;Index;178



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