Jalabert / Vickridge / Chabli Swift Ion Beam Analysis in Nanosciences

1. Auflage 2017
ISBN: 978-1-119-00873-6
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 280 Seiten, E-Book

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment.
Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods.

Autoren/Hrsg.

Jalabert, Denis

Vickridge, Ian

Chabli, Amal

Inhaltsverzeichnis

1. Fundamentals of Ion-solid Interactions with a Focus on the Nanoscale.
2. Instruments and Methods.
3. Applications.
4. The Place of NanoIBA in the Characterization Forest.