Resonant X-Ray Scattering in Correlated Systems

1. Auflage 2017
ISBN: 978-3-662-53225-6
Verlag: Springer

Buch, Englisch, Band 269, 241 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 5029 g

Reihe: Springer Tracts in Modern Physics

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Zielgruppe

Research

Autoren/Hrsg.

Ishihara, Sumio

Murakami, Youichi

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
• Naturwissenschaften Chemie Analytische Chemie Magnetresonanz
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Technische Wissenschaften Technik Allgemein Nanotechnologie

Inhaltsverzeichnis

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).

Über Autor(innen)

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.
Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.