Huertas Sánchez / Vázquez García de la Vega / Rueda Rueda Oscillation-Based Test in Mixed-Signal Circuits

1. Auflage 2007
ISBN: 978-1-4020-5315-3
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 36, 452 Seiten, eBook

Reihe: Frontiers in Electronic Testing

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Huertas Sánchez, Gloria

Vázquez García de la Vega, Diego

Rueda Rueda, Adoración

Huertas Díaz, Jose Luis

Inhaltsverzeichnis

Oscillation-Based Test Methodology.- Mathematical Review of Non-linear Oscillators.- OBT Methodology for Discrete-Time Filters.- OBT Methodology for discrete-time ?? Modulators.- OBT Implementation in Discrete-Time Filters.- Practical regards for OBT-OBIST implementation.- OBT-OBIST silicon validation.

Über Autor(innen)

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.