Oscillation-Based Test in Mixed-Signal Circuits

2006
ISBN: 978-1-4020-5314-6
Verlag: Springer Netherlands

Buch, Englisch, Band 36, 452 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 1840 g

Reihe: Frontiers in Electronic Testing

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Huertas Sánchez, Gloria

Huertas Díaz, Jose Luis

Vázquez García de la Vega, Diego

Rueda Rueda, Adoración

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Geisteswissenschaften Design Produktdesign, Industriedesign
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Technik Allgemein Konstruktionslehre und -technik

Inhaltsverzeichnis

Oscillation-Based Test Methodology.- Mathematical Review of Non-linear Oscillators.- OBT Methodology for Discrete-Time Filters.- OBT Methodology for discrete-time ?? Modulators.- OBT Implementation in Discrete-Time Filters.- Practical regards for OBT-OBIST implementation.- OBT-OBIST silicon validation.

Über Autor(innen)

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.