Advances in Imaging and Electron Physics

Erscheinungsjahr 2006
ISBN: 978-0-12-014782-3
Verlag: William Andrew Publishing

Buch, Englisch, 336 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 630 g

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Metallische Werkstoffe
• Naturwissenschaften Physik Mechanik Klassische Mechanik, Newtonsche Mechanik
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Metallurgie

Inhaltsverzeichnis

Preface

Future contributions

Recursive Neural Networks and Their Applications to Image Processing

Deterministic Learning and an Application in Optimal Control

X-Ray Fluorescence Holography

A Taxonomy of Color Image Filtering and Enhancement Solutions

General Sweep Mathematical Morphology

Index

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.