Haugstad Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications
1. Auflage 2012
ISBN: 978-1-118-36069-9
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 496 Seiten, E-Book

This book enlightens readers on the basic surfaceproperties and distance-dependent intersurface forces one mustunderstand to obtain even simple data from an atomic forcemicroscope (AFM). The material becomes progressively more complexthroughout the book, explaining details of calibration, physicalorigin of artifacts, and signal/noise limitations. Coverage spansimaging, materials property characterization, in-liquid interfacialanalysis, tribology, and electromagnetic interactions.
"Supplementary material for this book can be found byentering ISBN 9780470638828 on booksupport.wiley.com"

Autoren/Hrsg.

Haugstad, Greg

Über Autor(innen)

GREG HAUGSTAD, PhD, is a technical staff member andDirector of the Characterization Facility in the College of Scienceand Engineering at the University of Minnesota. He has collaboratedwith industry professionals on such technologies as medical X-rayimaging media, lubrication, inkjet printing, and more recently onbiomedical device coatings. He teaches undergraduate and graduateAFM courses, as well as short professional courses, and has trainedover 600 AFM users.