Buch, Englisch, Band 1234, 350 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 790 g
Proceedings of the 27th International Symposium, VDAT 2023
Buch, Englisch, Band 1234, 350 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 790 g
Reihe: Lecture Notes in Electrical Engineering
ISBN: 978-981-97-5268-3
Verlag: Springer Nature Singapore
This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Analysis of SQNR Degradation in Noise-Shaped SAR Analog-to-Digital Converters at High Input Signal Amplitudes.- An improved clock booster circuit suitable for boost converters in energy harvesting environments.- A Current-Mode-Logic Based PFD-Charge Pump Circuit for Low Reference Spur PLLs.- An Energy Efficient Mixed Logic 2-to-4 Decoder for Embedded Memory Applications.- Analysis and Modeling of Self-Heating and Substrate Induced Transitions in 5 nm Stacked Nanosheet FET.- Chemisorption Analysis of NOx Sensor Using NF/Pr-AGNR: A DFT Investigation.- Design and Analysis of Differential Configuration based Active Inductor for 5G Sub-6GHz Applications.- A Dual-Mode High-Frequency Grounded Memristor Emulator Circuit.- Demonstration of Doped-HfO2 Ferroelectric based Double Layer Stacked NC FinFET.- High Precision Programmable Thermistor Linearization ASIC for Electro-Optical Payload Applications.- Design and Analysis of Low-Power Protection Circuits for LDO Regulators.- Preventing Costly Iterations by Delivering SoC Congestion Aware Standard Cell Lib using Pin Accessibility Checker.- High Throughput Multiple Device Diagnosis System for Hierarchical Test Designs.- Characterization of Multi-Vt Transistors for Analog IC Design in Sub-nanometer Technologies.- Design and Analysis of Modified Strong Arm Latch Comparator with Reduced Kickback Noise.- Construction of non-rectangular floor plans for properly triangulated planar graphs.