X-Ray Diffraction Imaging

Technology and Applications
Erscheinungsjahr 2018
ISBN: 978-1-4987-8361-3
Verlag: Taylor & Francis Inc

Buch, Englisch, 278 Seiten, Format (B × H): 240 mm x 161 mm, Gewicht: 556 g

Reihe: Devices, Circuits, and Systems

This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.



- Teaches novel methods for X-ray diffraction imaging

- Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms

- Features state-of-the-art work of international authors from both academia and industry.

- Includes practical applications in the medical, industrial, and security sectors

Autoren/Hrsg.

Greenberg, Joel

Fachgebiete

• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Medizin | Veterinärmedizin Medizin | Public Health | Pharmazie | Zahnmedizin Medizin, Gesundheitswesen Medizintechnik, Biomedizintechnik, Medizinische Werkstoffe
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Lasertechnologie, Holographie
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Medizintechnik, Biomedizintechnik

Inhaltsverzeichnis

1 Coded Aperture X-Ray Diffraction Tomography. 2 Semiconductor Sensors for XRD Imaging. 3 Integrated Circuits for XRD Imaging. 4 Applications of X-Ray Diffraction Imaging in Medicine. 5 Materials Science of X-Ray Diffraction 6 X-Ray Diffraction and Focal Construct Technology. 7 X-Ray Diffraction Tomography: Methods and Systems. 8 Energy-Resolving Detectors for XDi Airport Security Systems.

Über Autor(innen)

Joel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection.