E-Book, Englisch, 396 Seiten
Gevorgian Ferroelectrics in Microwave Devices, Circuits and Systems
1. Auflage 2009
ISBN: 978-1-84882-507-9
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Physics, Modeling, Fabrication and Measurements
E-Book, Englisch, 396 Seiten
Reihe: Engineering Materials and Processes
ISBN: 978-1-84882-507-9
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Today's wireless communications and information systems are heavily based on microwave technology. Current trends indicate that in the future along with - crowaves, the millimeter wave and Terahertz technologies will be used to meet the growing bandwidth and overall performance requirements. Moreover, motivated by the needs of the society, new industry sectors are gaining ground; such as wi- less sensor networks, safety and security systems, automotive, medical, envir- mental/food monitoring, radio tags etc. Furthermore, the progress and the pr- lems in the modern society indicate that in the future these systems have to be more user/consumer friendly, i. e. adaptable, reconfigurable and cost effective. The mobile phone is a typical example which today is much more than just a phone; it includes a range of new functionalities such as Internet, GPS, TV, etc. To handle, in a cost effective way, all available and new future standards, the growing n- ber of the channels and bandwidth both the mobile handsets and the associated systems have to be agile (adaptable/reconfigurable). The complex societal needs have initiated considerable activities in the field of cognitive and software defined radios and triggered extensive research in adequate components and technology platforms. To meet the stringent requirements of these systems, especially in ag- ity and cost, new components with enhanced performances and new functionalities are needed. In this sense the components based on ferroelectrics have greater - tential and already are gaining ground.
Spartak Gevorgian obtained his DrSci in Electrical and Electronics Engineering from the Electrotechnical University, St. Petersburg, Russia. He works as a profesor for the Chalmers University of Technology and also part-time for Ericsson AB, Mölndal, Sweden. As well as having been a professor for his former university in St. Petersburg, Spartak Gevorgian has also worked at the Polytechnic Institute, Yerevan, Armenia. He has been the co-ordinator of several EU projects, including NANOSTAR and MELODY.
Autoren/Hrsg.
Weitere Infos & Material
1;Preface;7
2;Contents;10
3;Abbreviations;16
4;Chapter 1 Introduction: Overview of Agile Microwave Technologies;19
4.1;1.1 Introduction;19
4.2;1.2 Ferroelectrics: The Main Material Properties;20
4.3;1.3 Microwave Applications;25
4.4;1.4 Other Agile Microwave Technologies;33
4.5;1.5 Conclusions;36
4.6;References;36
5;Chapter 2 Physics of the Tunable Ferroelectric Devices;38
5.1;2.1 Introduction;38
5.2;2.2 Crystal Structure, Non-Polar (Paraelectric) and Polar (Ferroelectric) Phases;39
5.3;2.3 Dielectric Models of the Ferroelectric and Paraelectric Phases;41
5.4;2.4 Engineering Models of the Dielectric Permittivity;46
5.5;2.5 Models of the Loss Tangent;54
5.6;2.6 Dielectric Nonlinearities;61
5.7;2.7 Thin Films vs. Bulk;63
5.8;2.8 Electro-Acoustic Properties;69
5.9;2.9 Bulk Conductivity;73
5.10;2.10 Conclusions;74
5.11;References;74
6;Chapter 3 Fabrication of Ferroelectric Components and Devices;77
6.1;3.1 Introduction;77
6.2;3.2 Fabrication of Devices Using Single Crystals;79
6.3;3.3 Fabrication of Devices Using Bulk Ceramics;84
6.4;3.4 Thick Film, HTCC and LTCC Technologies;90
6.5;3.5 Fabrication of Thin Ferroelectric Films;96
6.6;3.6 Thin Film Device Processing;114
6.7;3.7 Substrate Micromachining and Passivation;122
6.8;3.8 Conclusions;124
6.9;References;125
7;Chapter 4 Substrates, Varactors and Passive Components;130
7.1;4.1 Introduction;130
7.2;4.2 Substrates;131
7.3;4.3 Varactors. Basic Designs and Figure of Merit;140
7.4;4.4 Equivalent Circuit Model of the Varactors;154
7.5;4.5 Low Frequency and Tuning Performances;159
7.6;4.6 Microwave Performance;166
7.7;4.7 Power Handling Capability and High Power Varactors;177
7.8;4.8 Ferroelectrics in Passive Devices as High Permittivity Dielectric;180
7.9;4.9 Conclusions;184
7.10;References;185
8;Chapter 5 Ferroelectric Devices;189
8.1;5.1 Introduction;189
8.2;5.2 Tunable Delay Lines and Delay Line Type Phase Shifters;190
8.3;5.3 Phase Shifters;201
8.4;5.4 Tunable Filters;210
8.5;5.5 Matching Networks (Impedance Tuners);218
8.6;5.6 Power Splitters;220
8.7;5.7 Antennas;221
8.8;5.8 Nonlinear Devices;222
8.9;5.9 TFBARs;226
8.10;5.10 Conclusions;231
8.11;References;231
9;Chapter 6 Circuit and System Applications of Tunable Ferroelectric Devices;238
9.1;6.1 Introduction;238
9.2;6.2 Voltage Controlled Oscillators;239
9.3;6.3 Amplifiers;242
9.4;6.4 Steerable Phased Array and Beam Antennas;244
9.5;References;255
10;Chapter 7 Modeling;257
10.1;7.1 Introduction;257
10.2;7.2 Coplanar-Plate Transmission Lines;258
10.3;7.3 Multilayer Substrate Coplanar-Plate Capacitors;272
10.4;7.4 Parallel-Plate Capacitor;279
10.5;7.5 Conclusions;283
10.6;Appendix A;285
10.7;Appendix B;288
10.8;Appendix C;292
10.9;Appendix D;297
10.10;References;297
11;Chapter 8 Measurements of the Dielectric Properties;299
11.1;8.1 Introduction;299
11.2;8.2 Resonant Techniques;301
11.3;8.3 Broadband Techniques;329
11.4;8.4 Nonlinear Measurements of Ferroelectrics;342
11.5;8.5 Switching Time of Ferroelectric Films;344
11.6;8.6 Conclusions;346
11.7;Appendix E;348
11.8;Appendix F;355
11.9;Appendix G;358
11.10;References;359
12;Chapter 9 Potentials and Perspectives;362
12.1;9.1 Introduction;362
12.2;9.2 Multiferroics;363
12.3;9.3 Ferroelectric Nanotubes. Ferromagnetic Nanowires;365
12.4;9.4 Metamaterials;368
12.5;9.5 Bridging the “THz Gap”;371
12.6;9.6 Other Tunable Materials;372
12.7;9.7 Other/New Effects;381
12.8;9.8 Conclusions;384
12.9;References;385
13;Chapter 10 Concluding Remarks;390
13.1;10.1 Introduction;390
13.2;10.2 Stabilization of the Temperature Dependences;390
13.3;10.3 Nonlinearity and Power Handling Capability;395
13.4;10.4 Hysteresis, Retention, Long Term Stability and Noise;395
13.5;10.5 Reliability;398
13.6;10.6 Integration Trends;399
13.7;References;400
14;Index;402




