Buch, Englisch, Band 319, 312 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 641 g
Reihe: NATO Science Series E:
Imaging and Storing with Photonic Near Fields
Buch, Englisch, Band 319, 312 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 641 g
Reihe: NATO Science Series E:
ISBN: 978-0-7923-4020-1
Verlag: Springer Netherlands
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
- Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Naturwissenschaften Physik Elektromagnetismus Optik
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
- Naturwissenschaften Physik Physik Allgemein Experimentalphysik
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
- Naturwissenschaften Physik Physik Allgemein Theoretische Physik, Mathematische Physik, Computerphysik
Weitere Infos & Material
Theory and Basic Principles.- Theory of Imaging in Near-Field Microscopy.- Light Scattering by Tips in Front of Surfaces.- A Numerical Study of a Model Near-Field Optical Microscope.- Short and Long Range Interactions in Near Field Optics.- Modelling Optical Resonators Probed by Subwavelength Sized Optical Detectors.- Experiments: Fundamentals and Applications.- Instrumentation in Near Field Optics.- Effect of the Coherence in Near Field Microscopy.- Scanning Interferometric Apertureless Microscopy at Ten Angstrom Resolution.- Primary Imaging Modes in Near-Field Microscopy.- Local Excitation of Surface Plasmons by TNOM.- Weak Localization of Surface Plasmon Polaritons: Direct Observation with Photon Scanning Tunneling Microscope.- STM-Induced Photon Emission from Au (110).- Writing of Nanolines on a Ferroelectric Surface with a Scanning Near-Field Optical Microscope.- Near Field Optics with High-Q Whispering-Gallery Modes.- Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM).- Fluorescence Lifetime Contrast Combined with Probe Microscopy.- Towards SNIM: Scanning Near-Field Microscopy in the Infrared.- 6 NM Lateral Resolution in Scanning Near Field Optical Microscopy with the Tetrahedral Tip.- An Aperture-Type Reflection-Mode SNOM.- Surface Modifications Via Photo-Chemistry in a Reflection Scanning Near-Field Optical Microscope.- Near-Field Diffraction Microscopy with a Coherent Low-Energy e-Beam: Fresnel Projection Microscope.- Author Index.