Fisher Defects and Diffusion in Semiconductors - An Annual Retrospective VII

Erscheinungsjahr 2004
ISBN: 978-3-0357-0739-7
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 540 Seiten

This seventh volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VI (Volumes 221-223) and the end of September 2004 (allowing for vagaries of journal availability).

Autoren/Hrsg.

Fisher, David

Fisher, David J.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde

Inhaltsverzeichnis

The Characterization of Defects in Silicon Carbide Crystals by X-Ray Topography in the Back-Reflection Geometry
Progress in Wide Bandgap Ferromagnetic Semiconductors and Semiconducting Oxides
Calculating the Properties of Defects in Semiconductors at Finite Temperatures
Role of Cation Vacancy-Related Defects in Self-Assembling of CdSe Quantum Dots
Radiation-Induced Defect Formation in Ternary Ge-As-S Vitreous Semiconductors
First Principles Calculations of Hydrogen Aggregation in Silicon
Anisotropy of Strain Relaxation in III-V Semiconductor Heterostructures
On the Photo-Ionization Cross-Section of DX Centers
Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy
Investigation and Identification of Transition Metals in p-Type Boron-Doped Silicon by Non-Invasive Techniques
Classification of Defects on Semiconductor Wafers Using Priority Rules
Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium
Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon
Nitrogen in Silicon
Modelling of Staebler-Wronski Effect in Hydrogenated Amorphous Silicon under Moderate and Intense Illumination
Defect Engineering in Impurity-Free Disordered (Al)GaAs for Optoelectronic Devices Application